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<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.47612/0514-7506-2022-89-3-405-409</article-id><article-id custom-type="elpub" pub-id-type="custom">zhps-1060</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>Определение запрещенной зоны из спектра возбуждения фотопроводимости</article-title><trans-title-group xml:lang="en"><trans-title>Band Gap Determination from Photoconductivity Excitation Spectra</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Толкачёв</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Tolkachev</surname><given-names>V. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Минск</p></bio><bio xml:lang="en"><p>Minsk</p></bio><email xlink:type="simple">tolkachev@ifanbel.bas-net.by</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Институт физики НАН Беларуси</institution></aff><aff xml:lang="en"><institution>B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2022</year></pub-date><pub-date pub-type="epub"><day>26</day><month>05</month><year>2022</year></pub-date><volume>89</volume><issue>3</issue><fpage>405</fpage><lpage>409</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Толкачёв В.А., 2022</copyright-statement><copyright-year>2022</copyright-year><copyright-holder xml:lang="ru">Толкачёв В.А.</copyright-holder><copyright-holder xml:lang="en">Tolkachev V.A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/1060">https://zhps.ejournal.by/jour/article/view/1060</self-uri><abstract><p>Показана возможность определения ширины прямой и непрямой запрещенной зоны из спектра фотопроводимости. На примере различных структур показано, что ширина запрещенной зоны, определенная из спектра фотопроводимости, отличается от определяемой из оптического краевого спектра. В композиционных структурах тестируемым методом могут индицироваться и примесные запрещенные зоны.</p></abstract><trans-abstract xml:lang="en"><p>The possibility to determine the direct and indirect band gap from photoconductivity spectrum is shown. Using various structures as an example, it is shown, that the band gap determined from the photoconductivity spectrum differs from the one determined from the edge optical spectrum. By this method in composite structures it is possible to indicate impurity band gaps.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>полупроводник</kwd><kwd>спектр фотопроводимости</kwd><kwd>краевой оптический спектр</kwd><kwd>запрещенная зона фотопроводимости</kwd><kwd>однородность фотополупроводника</kwd><kwd>примесные запрещенные зоны</kwd></kwd-group><kwd-group xml:lang="en"><kwd>semiconductor</kwd><kwd>photoconductivity spectrum</kwd><kwd>edge optical absorption</kwd><kwd>photoconductivity band gap</kwd><kwd>photosemiconductor homogeneity</kwd><kwd>impurity band gaps</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Автор признателен проф. Н. А. Поклонскому за обсуждения работы.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">В. А. Толкачёв. Журн. прикл. спектр., 84, № 4 (2017) 648—654 [V. A. Tolkachev. J. Appl. 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