<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-1298</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>АННОТАЦИИ АНГЛОЯЗЫЧНЫХ СТАТЕЙ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ABSTRACTS ENGLISH-LANGUAGE ARTICLES</subject></subj-group></article-categories><title-group><article-title>Определение шероховатости поверхности материалов высокоскоростных железнодорожных колес на основе лазерно-искровой эмиссионной спектроскопии</article-title><trans-title-group xml:lang="en"><trans-title>Surface Roughness Study of High-Speed Railway Wheel Materials Based on Laser-Induced Breakdown Spectroscopy</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ouyang</surname><given-names>A.</given-names></name><name name-style="western" xml:lang="en"><surname>Ouyang</surname><given-names>A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Ouyang Aiguo.</p><p>Наньчан</p></bio><bio xml:lang="en"><p>Aiguo Ouyang.</p><p>Nanchang</p></bio><email xlink:type="simple">ouyang1968711@163.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Yu</surname><given-names>B.</given-names></name><name name-style="western" xml:lang="en"><surname>Yu</surname><given-names>B.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Yu Bin.</p><p>Наньчан</p></bio><bio xml:lang="en"><p>Bin Yu.</p><p>Nanchang</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Hu</surname><given-names>J.</given-names></name><name name-style="western" xml:lang="en"><surname>Hu</surname><given-names>J.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Hu Jun.</p><p>Наньчан</p></bio><bio xml:lang="en"><p>Jun Hu.</p><p>Nanchang</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Lin</surname><given-names>T.</given-names></name><name name-style="western" xml:lang="en"><surname>Lin</surname><given-names>T.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Lin Tongzheng.</p><p>Наньчан</p></bio><bio xml:lang="en"><p>Tongzheng Lin.</p><p>Nanchang</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Liu</surname><given-names>Y.</given-names></name><name name-style="western" xml:lang="en"><surname>Liu</surname><given-names>Ya.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Liu Yande.</p><p>Наньчан</p></bio><bio xml:lang="en"><p>Yande Liu.</p><p>Nanchang</p></bio><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Школа механики и электротехники Восточно-Китайского университета Цзяотун</institution></aff><aff xml:lang="en"><institution>School of Mechanical &amp; Electrical Engineering, East China Jiaotong University</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2023</year></pub-date><pub-date pub-type="epub"><day>31</day><month>05</month><year>2023</year></pub-date><volume>90</volume><issue>3</issue><fpage>521</fpage><lpage>9</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ouyang A., Yu B., Hu J., Lin T., Liu Y., 2023</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="ru">Ouyang A., Yu B., Hu J., Lin T., Liu Y.</copyright-holder><copyright-holder xml:lang="en">Ouyang A., Yu B., Hu J., Lin T., Liu Y.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/1298">https://zhps.ejournal.by/jour/article/view/1298</self-uri><abstract><p>С помощью лазерно-искровой эмиссионной спектроскопии (LIBS) получена спектральная информация для семи образцов колес высокоскоростных поездов ER8 с различной шероховатостью поверхности. Исследованы корреляции между интенсивностью спектральных линий, их отношением и шероховатостью поверхности образцов. Показано, что интенсивности спектральных линий основного элемента Fe и легирующих элементов Cr, Mo и V, отношения интенсивностей ионных линий к атомным линиям и отношения интенсивностей спектральных линий легирующих элементов к основным элементам коррелируют с шероховатостью поверхности образцов в разной степени. Модели случайного леса (RF) с интенсивностями спектральных линий и отношениями интенсивностей спектральных линий в качестве переменных использованы для корреляций. Проанализирована шероховатость поверхности материалов высокоскоростных железнодорожных колес с использованием LIBS и алгоритма RF. Метод можно использовать для измерения и оценки шероховатости поверхности колес в полевых условиях, обеспечив основу для применения LIBS при исследовании колес высокоскоростных железных дорог с различной шероховатостью поверхности.</p></abstract><trans-abstract xml:lang="en"><p>An experimental platform of laser-induced breakdown spectroscopy (LIBS) is used to obtain the spectral information of seven ER8 high-speed train wheel samples with different surface roughnesses; the correlations between their spectral line intensities and the ratios of spectral line intensities to the surface roughnesses of the samples are investigated. The results show that the spectral line intensities of the base element Fe and the alloying elements Cr, Mo, and V, the intensity ratios of ion lines to atomic lines, and the spectral line intensity ratios of alloying elements to base elements are all correlated with the surface roughnesses of the samples to different degrees. In addition, random forest (RF) models with spectral line intensities and spectral line intensities with spectral line intensity ratios as variables are established using the correlations. The study shows that it is feasible to qualitatively analyze the surface roughnesses of high-speed railway wheel materials using laser-induced breakdown spectroscopy with an RF algorithm; this technique can be used to measure and evaluate the surface roughnesses of wheels in the field and provide some basis for the application of LIBS technology to the study of high-speed railway wheels with different surface roughnesses.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>лазерно-искровая эмиссионная спектроскопия</kwd><kwd>шероховатость поверхности материала колеса высокоскоростного поезда</kwd><kwd>интенсивность спектральной линии</kwd><kwd>модель случайного леса</kwd></kwd-group><kwd-group xml:lang="en"><kwd>laser-induced breakdown spectroscopy</kwd><kwd>high-speed train wheel material surface roughness</kwd><kwd>spectral line intensity</kwd><kwd>random forest</kwd></kwd-group><funding-group><funding-statement xml:lang="en">This work was supported by the National Natural Science Foundation of China (Grant No. 31760344), the Science and Technology Research Project of Jiangxi Provincial Education Department (GJJ60516), and Jiangxi Province Advantageous Science and Technology Innovation Team Construction Program Project (20153BCB24002).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">W. 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