<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-1682</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>АННОТАЦИИ АНГЛОЯЗЫЧНЫХ СТАТЕЙ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ABSTRACTS ENGLISH-LANGUAGE ARTICLES</subject></subj-group></article-categories><title-group><article-title>Анализ уровня углерода в сталях с использованием лазерно-искровой эмиссионной спектроскопии и алгоритма случайного леса</article-title><trans-title-group xml:lang="en"><trans-title>Random-Forest Analysis of Carbon Levels in Steels Using Laser-Induced Breakdown Spectroscopy</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>K.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>K.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Хэнань; Пиндиншань</p></bio><bio xml:lang="en"><p>Henan; Pingdingshan </p></bio><email xlink:type="simple">kuohuli@aliyun.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Wang</surname><given-names>X.</given-names></name><name name-style="western" xml:lang="en"><surname>Wang</surname><given-names>X.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Хэнань; Пиндиншань</p></bio><bio xml:lang="en"><p>Henan; Pingdingshan </p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Wang</surname><given-names>J.</given-names></name><name name-style="western" xml:lang="en"><surname>Wang</surname><given-names>J.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Хэнань; Пиндиншань</p></bio><bio xml:lang="en"><p>Henan; Pingdingshan </p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Yang</surname><given-names>P.</given-names></name><name name-style="western" xml:lang="en"><surname>Yang</surname><given-names>P.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Цзянсу; Чанчжоу</p></bio><bio xml:lang="en"><p>Jiangsu; Changzhou </p></bio><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Tian</surname><given-names>G.</given-names></name><name name-style="western" xml:lang="en"><surname>Tian</surname><given-names>G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Хэнань; Пиндиншань</p></bio><bio xml:lang="en"><p>Henan; Pingdingshan </p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>X.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>X.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Хубэй; Ухань</p></bio><bio xml:lang="en"><p>Hubei; Wuhan </p></bio><email xlink:type="simple">xyli@mail.hust.edu.cn</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Школа электротехники и машиностроения Университета Пиндиншань</institution></aff><aff xml:lang="en"><institution>School of Electrical and Mechanical Engineering, and Henan Key Laboratory of Research for Central Plains Ancient Ceramics, Pingdingshan University</institution></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Институт электроники, Колледж информационных технологий Чанчжоу</institution></aff><aff xml:lang="en"><institution>Institute of Electronic, Changzhou College of Information Technology</institution></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Уханьская национальная лаборатория оптоэлектроники (WNLO) Технологического университета Хуачжун</institution></aff><aff xml:lang="en"><institution>Wuhan National Laboratory for Optoelectronics (WNLO), Huazhong University of Science and Technology</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>25</day><month>10</month><year>2024</year></pub-date><volume>91</volume><issue>5</issue><fpage>764</fpage><lpage>764</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Li K., Wang X., Wang J., Yang P., Tian G., Li X., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Li K., Wang X., Wang J., Yang P., Tian G., Li X.</copyright-holder><copyright-holder xml:lang="en">Li K., Wang X., Wang J., Yang P., Tian G., Li X.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/1682">https://zhps.ejournal.by/jour/article/view/1682</self-uri><abstract><p>   Уровень углерода в образцах низколегированной стали измерен с помощью лазерно-искровой эмиссионной спектроскопии (LIBS) и алгоритма случайного леса (RF). При использовании алгоритма RF критерий среднеквадратической ошибки перекрестной проверки (RMSECV) сначала использован для выбора спектрального диапазона спектральных переменных для входных данных модели RF, чтобы предотвратить переобучение модели RF, когда только несколько релевантных переменных сопровождаются множеством других переменных. Затем критерий ошибки “ out-of-bag” (OOB) использован для оптимизации количества деревьев решений (ntree) и характеристических переменных (mtry) в RF-модели, которая оптимизирует структуру RF. Наличие большого количества релевантной спектральной информации в сочетании с хорошей регрессионной способностью RF значительно улучшает аналитическую точность измерений углерода. Среднеквадратическая ошибка прогнозирования RMSEP — 0.034 мас. % для метода калибровочной кривой и 0.023 мас. % для метода RF; снижение, обеспечиваемое последним методом, составило 32.4 %. RF-метод позволил повысить аналитическую точность определения углерода для низколегированных сталей.</p></abstract><trans-abstract xml:lang="en"><p>   The carbon levels in low-alloy steel samples were measured using laser-induced breakdown spectroscopy (LIBS) and a random forest (RF) method. When employing the RF method, the root-mean-square error of cross-validation (RMSECV) criterion was first used to select the spectral range of the spectral variables for RF model input, to prevent over-fitting of the RF model when only a few relevant variables are accompanied by many other variables. Second, the out-of-bag (OOB) error criterion was used to optimize the numbers of decision trees (ntree) and characteristic variables (mtry) in the RF model, which optimizes the RF structure. The availability of a large amount of relevant spectral information, coupled with the remarkable regression capacity of RF, greatly improved the carbon analytical accuracy. The results showed that the root-mean-square error of prediction (RMSEP) was 0.034 wt. % for the calibration curve method and 0.023 wt. % for the RF method; the reduction afforded by the latter method was 32.4 %. Thus, the RF method improved the carbon analytical accuracy for low-alloy steels.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>лазерно-искровая эмиссионная спектроскопия</kwd><kwd>количественный анализ</kwd><kwd>сталь</kwd><kwd>углерод</kwd><kwd>алгоритм случайного леса</kwd></kwd-group><kwd-group xml:lang="en"><kwd>laser-induced breakdown spectroscopy</kwd><kwd>quantitative analysis</kwd><kwd>steel</kwd><kwd>carbon</kwd><kwd>random forest</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Это исследование было проведено при финансовой поддержке Национального специального фонда для разработки основного исследовательского оборудования и приборов (грант № 2011YQ160017), Научно-технического проекта Департамента науки и технологий провинции Хэнань (гранты № 232102220014, 232102210055 и 222102210214), Научно-технической программы Чанчжоу (грант №CE20232020), проекта Молодежного фонда Университета Пиндиншань (грант № PXY-QNJJ-202001) и программы ключевых исследовательских проектов Института высшего образования провинции Хэнань (грант № 19A470004)</funding-statement><funding-statement xml:lang="en">This research was financially supported by the National Special Fund for the Development of Major Research Equipment and Instruments (Grant No. 2011YQ160017), the Science and Technology Project of Henan Science and Technology Department (Grant Nos. 232102220014, 232102210055, and 222102210214), the Changzhou Sci&amp;Tech Program (Grant No.CE20232020), the Youth Fund Project of Pingdingshan University (Grant No. PXY-QNJJ-202001), and the Key Research Projects program of the Institute of Higher Learning of Henan Province (Grant No. 19A470004)</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">J. 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