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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-1770</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>АННОТАЦИИ АНГЛОЯЗЫЧНЫХ СТАТЕЙ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>ABSTRACTS ENGLISH-LANGUAGE ARTICLES</subject></subj-group></article-categories><title-group><article-title>Нелинейно-оптические свойства третьего порядка тонкой нанопленки NiO при использовании излучения маломощного лазера в непрерывном режиме</article-title><trans-title-group xml:lang="en"><trans-title>THIRD-ORDER NONLINEAR OPTICAL PROPERTIES OF NANO NiO THIN FILM DETERMINED USING CONTINUOUS WAVE LOW-POWER LASER</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Saied</surname><given-names>E. A.</given-names></name><name name-style="western" xml:lang="en"><surname>Saied</surname><given-names>Eman Abdulmajed</given-names></name></name-alternatives><bio xml:lang="ru"><p>Эрбиль, Курдистан</p></bio><bio xml:lang="en"><p>Erbil, Kurdistan region</p></bio><email xlink:type="simple">eman.saied@su.edu.krd</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Университет Салахаддина-Эрбиль</institution></aff><aff xml:lang="en"><institution>Department of Physics, College of Science, Salahaddin University-Erbil</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>07</day><month>02</month><year>2025</year></pub-date><volume>92</volume><issue>1</issue><fpage>131</fpage><lpage>131</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Saied E.A., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Saied E.A.</copyright-holder><copyright-holder xml:lang="en">Saied E.A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/1770">https://zhps.ejournal.by/jour/article/view/1770</self-uri><abstract><p>Наночастицы оксида никеля (NiO) получены с использованием метода золь-гель-покрытия для создания тонкой пленки NiO/стекло и кремния. Методами ИК-Фурье-спектроскопии, УФ-видимой спектроскопии и сканирующей электронной микроскопии изучены структурные и оптические свойства пленок. Нелинейные оптические характеристики тонкой пленки NiO исследованы с помощью методов Z-сканирования с открытой и закрытой апертурой на длинах волн 532 и 635 нм. Варьирование оптической интенсивности лазера и длины волны изменяло показатель преломления образцов, так как увеличение интенсивности лазера и длины волны приводило к уменьшению нелинейного показателя преломления. Коэффициент нелинейного поглощения демонстрирует отрицательную корреляцию с интенсивностью лазера и небольшую убывающую связь с длиной волны. </p></abstract><trans-abstract xml:lang="en"><p>Nickel oxide nanoparticles (NiO) were produced using the sol-gel dip-coating method to create NiO/glass and silicon thin film. Fourier transform infrared spectroscopy, ultraviolet-visible spectroscopy, and scanning electron microscopy were used to examine the film’s structural and optical properties. The nonlinear optical characteristics of the nickel oxide thin film were examined using the open aperture and close aperture Z-scan methods at wavelengths of 532 and 635 nm. Manipulating the laser optical intensities and wavelengths altered the refractive index of the samples in that increasing the laser intensities and wavelengths led to a decrease in the nonlinear refractive index. The nonlinear absorption coefficient exhibited a negative correlation with laser intensity and a small decreasing relationship with the wavelength. </p></trans-abstract><kwd-group xml:lang="ru"><kwd>наночастица оксида никеля</kwd><kwd>нелинейная оптика</kwd><kwd>сканирующая электронная микроскопия</kwd><kwd>Z-сканирование</kwd></kwd-group><kwd-group xml:lang="en"><kwd>nickel oxide nanoparticle</kwd><kwd>non-linear optic</kwd><kwd>scanning electron microscopy</kwd><kwd>Z-scan</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">R. Yuvakkumar, J. Suresh, A. Joseph Nathanael, M. Sundrarajan, S. I. Hong, Mater. Lett., 128, 170–174 (2014), doi: 10.1016/j.matlet.2014.04.112.</mixed-citation><mixed-citation xml:lang="en">R. Yuvakkumar, J. Suresh, A. Joseph Nathanael, M. Sundrarajan, S. I. Hong, Mater. 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