<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-2083</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>Влияние состава на электронную структуру манганитов R1-xCaxMnO3 (R= Nd, Gd; x = 0.0, 0.2) по данным рентгеновской фотоэлектронной спектроскопии</article-title><trans-title-group xml:lang="en"><trans-title>Influence of Composition on the Electronic Structure of Manganites R1-xCaxMnO3 (R = Nd, Gd; x = 0.0, 0.2) According to X-Ray Photoelectron Spectroscopy Data</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Эстемирова</surname><given-names>С. Х.</given-names></name><name name-style="western" xml:lang="en"><surname>Estemirova</surname><given-names>S. Kh.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Екатеринбург</p></bio><bio xml:lang="en"><p>Ekaterinburg</p></bio><email xlink:type="simple">esveta100@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Институт металлургии им. Н. А. Ватолина УрО РАН; &#13;
Уральский федеральный университет имени первого Президента России Б. Н. Ельцина</institution></aff><aff xml:lang="en"><institution>N. A. Vatolin Institute of Metallurgy, Ural Branch of the Russian Academy of Sciences; &#13;
Ural Federal University named after the first President of Russia B. N. Yeltsin</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2026</year></pub-date><pub-date pub-type="epub"><day>22</day><month>01</month><year>2026</year></pub-date><volume>93</volume><issue>1</issue><fpage>57</fpage><lpage>68</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Эстемирова С.Х., 2026</copyright-statement><copyright-year>2026</copyright-year><copyright-holder xml:lang="ru">Эстемирова С.Х.</copyright-holder><copyright-holder xml:lang="en">Estemirova S.K.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/2083">https://zhps.ejournal.by/jour/article/view/2083</self-uri><abstract><p>Методом рентгеновской фотоэлектронной спектроскопии (РФЭС) исследованы манганиты CaMnO3 и R1–xCaxMnO3 (R = Nd, Gd; x = 0.0, 0.2). Проанализированы спектры остовных уровней всех элементов, входящих в состав соединений. Выявлены химические сдвиги, отражающие эволюцию валентных состояний ионов в зависимости от состава. На основе анализа мультиплетного расщепления спектров Mn 3s определены эффективные спиновые и зарядовые состояния ионов Mn. Полученные результаты расширяют существующую базу РФЭС-данных по электронной структуре манганитов и подтверждают эффективность метода для анализа валентности марганца в сложных оксидах.</p></abstract><trans-abstract xml:lang="en"><p>CaMnO3 and R1–xCaxMnO3 (R = Nd, Gd; x = 0.0, 0.2) manganites were studied using X-ray photoelectron spectroscopy (XPS). The core-level spectra of all the elements in the compounds were analyzed. Chemical shifts reflecting the evolution of the ion valence states depending on composition were identified. Based on an analysis of the multiplet splitting of Mn 3s spectra, the effective spin and charge states of Mn ions were determined. The obtained results expand the existing XPS database on the electronic structure of manganites and confirm the effectiveness of this method for analyzing the valence of manganese in complex oxides.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>манганиты</kwd><kwd>рентгеновская фотоэлектронная спектроскопия</kwd><kwd>валентное состояние</kwd><kwd>перовскитоподобная структура</kwd><kwd>мультиплетное расщепление</kwd></kwd-group><kwd-group xml:lang="en"><kwd>manganites</kwd><kwd>X-ray photoelectron spectroscopy</kwd><kwd>valence state</kwd><kwd>perovskite-like structure</kwd><kwd>multiplet splitting</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">R. von Helmolt, J. Wecker, B. Holzapfel, L. Schultz, K. Samwer. Phys. Rev. Lett., 71, N 14 (1993) 2331—2333</mixed-citation><mixed-citation xml:lang="en">R. von Helmolt, J. Wecker, B. Holzapfel, L. Schultz, K. Samwer. Phys. Rev. Lett., 71, N 14 (1993) 2331—2333</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">P. Schlottmann. Physica B, 404, N 18 (2009) 2699—2704, https://doi.org/10.1016/j.physb.2009.06.066</mixed-citation><mixed-citation xml:lang="en">P. Schlottmann. Physica B, 404, N 18 (2009) 2699—2704, https://doi.org/10.1016/j.physb.2009.06.066</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">S. Dong, H. Xiang, E. Dagotto. Nat. Sci. Rev., 6, N 4 (2019) 629—641, https://doi.org/10.1093/nsr/nwz023</mixed-citation><mixed-citation xml:lang="en">S. Dong, H. Xiang, E. Dagotto. Nat. Sci. Rev., 6, N 4 (2019) 629—641, https://doi.org/10.1093/nsr/nwz023</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">С. В. Адашкевич, С. А. Маркевич, С. В. Труханов, Г. Г. Федорук. Журн. прикл. спектр., 84 (2017) 664—667 [S. V. Adashkevich, S. A. Markevich, S. V. Trukhanov, G. G. Fedaruk. J. Appl. Spectr., 84, N 4 (2017) 683—686], https://doi.org/10.1007/s10812-017-0530-3</mixed-citation><mixed-citation xml:lang="en">С. В. Адашкевич, С. А. Маркевич, С. В. Труханов, Г. Г. Федорук. Журн. прикл. спектр., 84 (2017) 664—667 [S. V. Adashkevich, S. A. Markevich, S. V. Trukhanov, G. G. Fedaruk. J. Appl. Spectr., 84, N 4 (2017) 683—686], https://doi.org/10.1007/s10812-017-0530-3</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">С. Х. Эстемирова, А. В. Фетисов, В. Б. Фетисов. Журн. прикл. спектр., 76 (2009) 419—427 [S. K. Estemirova, A. V. Fetisov, V. B. Fetisov. J. Appl. Spectr., 76, N 3 (2009) 394—401], https://doi.org/10.1007/s10812-009-9180-4</mixed-citation><mixed-citation xml:lang="en">С. Х. Эстемирова, А. В. Фетисов, В. Б. Фетисов. Журн. прикл. спектр., 76 (2009) 419—427 [S. K. Estemirova, A. V. Fetisov, V. B. Fetisov. J. Appl. Spectr., 76, N 3 (2009) 394—401], https://doi.org/10.1007/s10812-009-9180-4</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">E. Beyreuther, S. Grafström, L. M. Eng, C. Thiele, K. Dörr. Phys. Rev. B, 73, N 15 (2006) 155425, https://doi.org/10.1103/PhysRevB.73.155425</mixed-citation><mixed-citation xml:lang="en">E. Beyreuther, S. Grafström, L. M. Eng, C. Thiele, K. Dörr. Phys. Rev. B, 73, N 15 (2006) 155425, https://doi.org/10.1103/PhysRevB.73.155425</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">V. R. Galakhov, B. A. Gizhevskii, L. V. Elokhina, N. N. Loshkareva, S. V. Naumov, M. Raekers, M. Neumann, A. M. Balbashov. JETP Lett., 91, N 3 (2010) 129—133, https://doi.org/10.1134/S0021364010030069</mixed-citation><mixed-citation xml:lang="en">V. R. Galakhov, B. A. Gizhevskii, L. V. Elokhina, N. N. Loshkareva, S. V. Naumov, M. Raekers, M. Neumann, A. M. Balbashov. JETP Lett., 91, N 3 (2010) 129—133, https://doi.org/10.1134/S0021364010030069</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">M. C. Falub, M. Shi, J. Krempasky, K. Hricovini, Ya. M. Mukovskii, M. Neumann, V. R. Galakhov, L. Patthey. Surf. Sci., 575, N 1-2 (2005) 29—34, https://doi.org/10.1016/j.susc.2004.10.053</mixed-citation><mixed-citation xml:lang="en">M. C. Falub, M. Shi, J. Krempasky, K. Hricovini, Ya. M. Mukovskii, M. Neumann, V. R. Galakhov, L. Patthey. Surf. Sci., 575, N 1-2 (2005) 29—34, https://doi.org/10.1016/j.susc.2004.10.053</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">V. V. Mesilov, V. R. Galakhov, S. N. Shamin, B. A. Gizhevskii, S. V. Naumov. J. Struct. Chem., 56, N 3 (2015) 497—503, https://doi.org/10.1134/S0022476615030166</mixed-citation><mixed-citation xml:lang="en">V. V. Mesilov, V. R. Galakhov, S. N. Shamin, B. A. Gizhevskii, S. V. Naumov. J. Struct. Chem., 56, N 3 (2015) 497—503, https://doi.org/10.1134/S0022476615030166</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">Yu. A. Teterin, A. Yu. Teterin. Russ. Chem. Rev., 71, N 5 (2002) 347—381, https://doi.org/10.1070/RC2002v071n05ABEH000717</mixed-citation><mixed-citation xml:lang="en">Yu. A. Teterin, A. Yu. Teterin. Russ. Chem. Rev., 71, N 5 (2002) 347—381, https://doi.org/10.1070/RC2002v071n05ABEH000717</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">N. Kamegashira, Y. Miyazaki. Mater. Res. Bull., 19, N 9 (1984) 1201—1206, https://doi.org/10.1016/0025-5408(84)90072-2</mixed-citation><mixed-citation xml:lang="en">N. Kamegashira, Y. Miyazaki. Mater. Res. Bull., 19, N 9 (1984) 1201—1206, https://doi.org/10.1016/0025-5408(84)90072-2</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">K. Kitayama, H. Ohno, Y. Ide, K. Satoh, S. Murakami. J. Solid State Chem., 166, N 2 (2002) 285—291, https://doi.org/10.1006/jssc.2002.9586</mixed-citation><mixed-citation xml:lang="en">K. Kitayama, H. Ohno, Y. Ide, K. Satoh, S. Murakami. J. Solid State Chem., 166, N 2 (2002) 285—291, https://doi.org/10.1006/jssc.2002.9586</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">S. K. Estemirova, V. F. Balakirev, A. M. Yankin, V. Ya. Mitrofanov, S. A. Uporov, V. M. Kozin, T. I. Filinkova. Glass Phys. Chem., 41, N 3 (2015) 224—231, https://doi.org/10.1134/S1087659615020066</mixed-citation><mixed-citation xml:lang="en">S. K. Estemirova, V. F. Balakirev, A. M. Yankin, V. Ya. Mitrofanov, S. A. Uporov, V. M. Kozin, T. I. Filinkova. Glass Phys. Chem., 41, N 3 (2015) 224—231, https://doi.org/10.1134/S1087659615020066</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">R. Kwok. XPS Peak Fitting Program, version 4.1 (2000), http://www.phy.cuhk.edu.hk/~sur- face/XPSPEAK/</mixed-citation><mixed-citation xml:lang="en">R. Kwok. XPS Peak Fitting Program, version 4.1 (2000), http://www.phy.cuhk.edu.hk/~sur- face/XPSPEAK/</mixed-citation></citation-alternatives></ref><ref id="cit15"><label>15</label><citation-alternatives><mixed-citation xml:lang="ru">R. D. Shannon. Acta Cryst. A, 32, N 5 (1976) 751—767, doi.org/10.1107/S0567739476001551</mixed-citation><mixed-citation xml:lang="en">R. D. Shannon. Acta Cryst. A, 32, N 5 (1976) 751—767, doi.org/10.1107/S0567739476001551</mixed-citation></citation-alternatives></ref><ref id="cit16"><label>16</label><citation-alternatives><mixed-citation xml:lang="ru">K. Siegbahn. ESCA; Atomic, Molecular and Solid States Structure Studied by Means of Electron Spectroscopy, Uneversity of Michigan, Almqvist &amp; Wiksells (1967)</mixed-citation><mixed-citation xml:lang="en">K. Siegbahn. ESCA; Atomic, Molecular and Solid States Structure Studied by Means of Electron Spectroscopy, Uneversity of Michigan, Almqvist &amp; Wiksells (1967)</mixed-citation></citation-alternatives></ref><ref id="cit17"><label>17</label><citation-alternatives><mixed-citation xml:lang="ru">C. Zhang, C. Wang, W. Hua, Y. Guo, G. Lu, S. Gil, A. Giroir-Fendler. Appl. Catal. B, 186 (2016) 173—183, https://doi.org/10.1016/j.apcatb.2015.12.052</mixed-citation><mixed-citation xml:lang="en">C. Zhang, C. Wang, W. Hua, Y. Guo, G. Lu, S. Gil, A. Giroir-Fendler. Appl. Catal. B, 186 (2016) 173—183, https://doi.org/10.1016/j.apcatb.2015.12.052</mixed-citation></citation-alternatives></ref><ref id="cit18"><label>18</label><citation-alternatives><mixed-citation xml:lang="ru">A. Santoni, G. Speranza, M. R. Mancini, F. Padella, L. Petrucci, S. Casadio. J. Phys. Cond. Matter, 11, N 16 (1999) 3387—3396, doi 10.1088/0953-8984/11/16/018</mixed-citation><mixed-citation xml:lang="en">A. Santoni, G. Speranza, M. R. Mancini, F. Padella, L. Petrucci, S. Casadio. J. Phys. Cond. Matter, 11, N 16 (1999) 3387—3396, doi 10.1088/0953-8984/11/16/018</mixed-citation></citation-alternatives></ref><ref id="cit19"><label>19</label><citation-alternatives><mixed-citation xml:lang="ru">L. Wang, H. Xie, X. Wang, G. Zhang, Y. Guo, Y. Guo, G. Lu. Chin. J. Catal., 38, N 8 (2017) 1406—1412, https://doi.org/10.1016/S1872-2067(17)62863-8</mixed-citation><mixed-citation xml:lang="en">L. Wang, H. Xie, X. Wang, G. Zhang, Y. Guo, Y. Guo, G. Lu. Chin. J. Catal., 38, N 8 (2017) 1406—1412, https://doi.org/10.1016/S1872-2067(17)62863-8</mixed-citation></citation-alternatives></ref><ref id="cit20"><label>20</label><citation-alternatives><mixed-citation xml:lang="ru">K. A. Stoerzinger, W. T. Hong, X. R. Wang, R. R. Rao, S. B. Subramanyam, C. Li, T. Venkatesan, Q. Liu, E. J. Crumlin, K. K. Varanasi, Y. Shao-Horn. Chem. Mater., 29, N 23 (2017) 9990—9997, doi: 10.1021/acs.chemmater.7b03399</mixed-citation><mixed-citation xml:lang="en">K. A. Stoerzinger, W. T. Hong, X. R. Wang, R. R. Rao, S. B. Subramanyam, C. Li, T. Venkatesan, Q. Liu, E. J. Crumlin, K. K. Varanasi, Y. Shao-Horn. Chem. Mater., 29, N 23 (2017) 9990—9997, doi: 10.1021/acs.chemmater.7b03399</mixed-citation></citation-alternatives></ref><ref id="cit21"><label>21</label><citation-alternatives><mixed-citation xml:lang="ru">M. J. Dzara, J. M. Christ, P. Joghee, C. Ngo, C. A. Cadigan, G. Bender, R. M. Richards, R. O’Hayre, S. Pylypenko. J. Power Sources, 375 (2018) 265—276, https://doi.org/10.1016/j.jpowsour.2017.08.071</mixed-citation><mixed-citation xml:lang="en">M. J. Dzara, J. M. Christ, P. Joghee, C. Ngo, C. A. Cadigan, G. Bender, R. M. Richards, R. O’Hayre, S. Pylypenko. J. Power Sources, 375 (2018) 265—276, https://doi.org/10.1016/j.jpowsour.2017.08.071</mixed-citation></citation-alternatives></ref><ref id="cit22"><label>22</label><citation-alternatives><mixed-citation xml:lang="ru">R. Dudric, R. Bortnic, G. Souca, R. Ciceo-Lucacel, R. Stiufiuc, R. Tetean. Appl. Surface Sci., 487 (2019) 17—21, https://doi.org/10.1016/j.apsusc.2019.04.233</mixed-citation><mixed-citation xml:lang="en">R. Dudric, R. Bortnic, G. Souca, R. Ciceo-Lucacel, R. Stiufiuc, R. Tetean. Appl. Surface Sci., 487 (2019) 17—21, https://doi.org/10.1016/j.apsusc.2019.04.233</mixed-citation></citation-alternatives></ref><ref id="cit23"><label>23</label><citation-alternatives><mixed-citation xml:lang="ru">D. Barreca, A. Gasparotto, A. Milanov, E. Tondello, A. Devi, R. A. Fischer. Surface Sci. Spectra, 14, N 1 (2007) 60—67, https://doi.org/10.1116/11.20080703</mixed-citation><mixed-citation xml:lang="en">D. Barreca, A. Gasparotto, A. Milanov, E. Tondello, A. Devi, R. A. Fischer. Surface Sci. Spectra, 14, N 1 (2007) 60—67, https://doi.org/10.1116/11.20080703</mixed-citation></citation-alternatives></ref><ref id="cit24"><label>24</label><citation-alternatives><mixed-citation xml:lang="ru">M. E Abrishami, M. Mohammadi, M. Sotoudeh. Crystals, 12, N 12 (2022) 1728, https://doi.org/10.3390/cryst12121728</mixed-citation><mixed-citation xml:lang="en">M. E Abrishami, M. Mohammadi, M. Sotoudeh. Crystals, 12, N 12 (2022) 1728, https://doi.org/10.3390/cryst12121728</mixed-citation></citation-alternatives></ref><ref id="cit25"><label>25</label><citation-alternatives><mixed-citation xml:lang="ru">S. P. Kowalczyk, N. Edelstein, F. R. McFeely, L. Ley, D. A. Shirley. Chem. Phys. Lett., 29, N 4 (1974) 491—495, https://doi.org/10.1016/0009-2614(74)85076-1</mixed-citation><mixed-citation xml:lang="en">S. P. Kowalczyk, N. Edelstein, F. R. McFeely, L. Ley, D. A. Shirley. Chem. Phys. Lett., 29, N 4 (1974) 491—495, https://doi.org/10.1016/0009-2614(74)85076-1</mixed-citation></citation-alternatives></ref><ref id="cit26"><label>26</label><citation-alternatives><mixed-citation xml:lang="ru">D. F. Mullica, C. K. C. Lok, H. O. Perkins, G. A. Benesh, V. Young. J. Electron Spectrosc. Relat. Phenom., 71, N 1 (1995) 1—20, https://doi.org/10.1016/0368-2048(94)02250-X</mixed-citation><mixed-citation xml:lang="en">D. F. Mullica, C. K. C. Lok, H. O. Perkins, G. A. Benesh, V. Young. J. Electron Spectrosc. Relat. Phenom., 71, N 1 (1995) 1—20, https://doi.org/10.1016/0368-2048(94)02250-X</mixed-citation></citation-alternatives></ref><ref id="cit27"><label>27</label><citation-alternatives><mixed-citation xml:lang="ru">D. D. Sarma C. N. R. Rao. Electron Spectrosc. Relat. Phenom, 20 (1980) 25—45</mixed-citation><mixed-citation xml:lang="en">D. D. Sarma C. N. R. Rao. Electron Spectrosc. Relat. Phenom, 20 (1980) 25—45</mixed-citation></citation-alternatives></ref><ref id="cit28"><label>28</label><citation-alternatives><mixed-citation xml:lang="ru">K. Zhi-jian, L. Li-ping, W. Quan. Chem. Res. Chin. Univ., 12, N 3 (1996) 280—284</mixed-citation><mixed-citation xml:lang="en">K. Zhi-jian, L. Li-ping, W. Quan. Chem. Res. Chin. Univ., 12, N 3 (1996) 280—284</mixed-citation></citation-alternatives></ref><ref id="cit29"><label>29</label><citation-alternatives><mixed-citation xml:lang="ru">A. Szytuła, D. Fus, B. Penc, A. Jezierski. J. Alloys Compd., 317-318 (2001) 340—346, https://doi.org/10.1016/S0925-8388(00)01427-4</mixed-citation><mixed-citation xml:lang="en">A. Szytuła, D. Fus, B. Penc, A. Jezierski. J. Alloys Compd., 317-318 (2001) 340—346, https://doi.org/10.1016/S0925-8388(00)01427-4</mixed-citation></citation-alternatives></ref><ref id="cit30"><label>30</label><citation-alternatives><mixed-citation xml:lang="ru">S. P. Kowalczyk, N. Edelstein, F. R. McFeely, L. Ley, D. A. Shirley. Chem. Phys. Lett., 29, N 4 (1984) 491—495</mixed-citation><mixed-citation xml:lang="en">S. P. Kowalczyk, N. Edelstein, F. R. McFeely, L. Ley, D. A. Shirley. Chem. Phys. Lett., 29, N 4 (1984) 491—495</mixed-citation></citation-alternatives></ref><ref id="cit31"><label>31</label><citation-alternatives><mixed-citation xml:lang="ru">W. J. Lademan, A. K. See, L. E. Klebanoff, G. van der Laan. Phys. Rev. B, 54, N 23 (1996) 17191—17198</mixed-citation><mixed-citation xml:lang="en">W. J. Lademan, A. K. See, L. E. Klebanoff, G. van der Laan. Phys. Rev. B, 54, N 23 (1996) 17191—17198</mixed-citation></citation-alternatives></ref><ref id="cit32"><label>32</label><citation-alternatives><mixed-citation xml:lang="ru">J. Liu, Z. An, W. Zhu, W. Zhang, Y. Liu, H. Wu, L. Liu. Sep. Purif. Technol., 354, N 1 (2025) 128749, https://doi.org/10.1016/j.seppur.2024.128749</mixed-citation><mixed-citation xml:lang="en">J. Liu, Z. An, W. Zhu, W. Zhang, Y. Liu, H. Wu, L. Liu. Sep. Purif. Technol., 354, N 1 (2025) 128749, https://doi.org/10.1016/j.seppur.2024.128749</mixed-citation></citation-alternatives></ref><ref id="cit33"><label>33</label><citation-alternatives><mixed-citation xml:lang="ru">J. T. Kloprogge, B. J. Wood. Handbook of Mineral Spectroscopy, 1, X-Ray Photoelectron Spectra, Elsevier, Amsterdam, The Netherlands (2020) 505</mixed-citation><mixed-citation xml:lang="en">J. T. Kloprogge, B. J. Wood. Handbook of Mineral Spectroscopy, 1, X-Ray Photoelectron Spectra, Elsevier, Amsterdam, The Netherlands (2020) 505</mixed-citation></citation-alternatives></ref><ref id="cit34"><label>34</label><citation-alternatives><mixed-citation xml:lang="ru">V. Celorrio, L. Calvillo, G. Granozzi, A. E. Russell, D. J. Fermin. Top. Catal., 61, N 1-2 (2018) 154—161, https://doi.org/10.1007/s11244-018-0886-5</mixed-citation><mixed-citation xml:lang="en">V. Celorrio, L. Calvillo, G. Granozzi, A. E. Russell, D. J. Fermin. Top. Catal., 61, N 1-2 (2018) 154—161, https://doi.org/10.1007/s11244-018-0886-5</mixed-citation></citation-alternatives></ref><ref id="cit35"><label>35</label><citation-alternatives><mixed-citation xml:lang="ru">A. T. Kozakov, A. G. Kochur, V. G. Trotsenko, A. V. Nikolskii, M. El Marssi, B. P. Gorshunov, V. I. Torgashev. J. Alloys Compd., 740 (2018) 132—142, https://doi.org/10.1016/j.jallcom.2018.01.002</mixed-citation><mixed-citation xml:lang="en">A. T. Kozakov, A. G. Kochur, V. G. Trotsenko, A. V. Nikolskii, M. El Marssi, B. P. Gorshunov, V. I. Torgashev. J. Alloys Compd., 740 (2018) 132—142, https://doi.org/10.1016/j.jallcom.2018.01.002</mixed-citation></citation-alternatives></ref><ref id="cit36"><label>36</label><citation-alternatives><mixed-citation xml:lang="ru">A. N. Ulyanov, K. I. Maslakov, C. Martin, D.-S. Yang, S. A. Chernyak, V. Markovich, S. V. Savilov. J. Alloys Compd., 820 (2020) 153106, https://doi.org/10.1016/j.jallcom.2019.153106</mixed-citation><mixed-citation xml:lang="en">A. N. Ulyanov, K. I. Maslakov, C. Martin, D.-S. Yang, S. A. Chernyak, V. Markovich, S. V. Savilov. J. Alloys Compd., 820 (2020) 153106, https://doi.org/10.1016/j.jallcom.2019.153106</mixed-citation></citation-alternatives></ref><ref id="cit37"><label>37</label><citation-alternatives><mixed-citation xml:lang="ru">L. Bubnowicz, R. França. Appl. Surface Sci. Adv., 11 (2022) 100306, https://doi.org/10.1016/j.apsadv.2022.100306</mixed-citation><mixed-citation xml:lang="en">L. Bubnowicz, R. França. Appl. Surface Sci. Adv., 11 (2022) 100306, https://doi.org/10.1016/j.apsadv.2022.100306</mixed-citation></citation-alternatives></ref><ref id="cit38"><label>38</label><citation-alternatives><mixed-citation xml:lang="ru">J.-L. Ortiz-Quiñonez, L. García-González, F. E. Cancino-Gordillo, U. Pal. Mater. Chem. Phys., 246 (2020) 122834, https://doi.org/10.1016/j.matchemphys.2020.122834</mixed-citation><mixed-citation xml:lang="en">J.-L. Ortiz-Quiñonez, L. García-González, F. E. Cancino-Gordillo, U. Pal. Mater. Chem. Phys., 246 (2020) 122834, https://doi.org/10.1016/j.matchemphys.2020.122834</mixed-citation></citation-alternatives></ref><ref id="cit39"><label>39</label><citation-alternatives><mixed-citation xml:lang="ru">V. D. Castro, G. Polzonetti. J. Electron Spectrosc. Relat. Phenom., 48 (1989) 117—123, https://doi.org/10.1016/0368-2048(89)80009-X</mixed-citation><mixed-citation xml:lang="en">V. D. Castro, G. Polzonetti. J. Electron Spectrosc. Relat. Phenom., 48 (1989) 117—123, https://doi.org/10.1016/0368-2048(89)80009-X</mixed-citation></citation-alternatives></ref><ref id="cit40"><label>40</label><citation-alternatives><mixed-citation xml:lang="ru">M. C. Biesinger, B. P. Payne, A. P. Grosvenor, L. W. M. Lau, A. R. Gerson, R. St. C. Smart. Appl. Surface Sci., 257, N 7 (2011) 2717—2730, https://doi.org/10.1016/j.apsusc.2010.10.051</mixed-citation><mixed-citation xml:lang="en">M. C. Biesinger, B. P. Payne, A. P. Grosvenor, L. W. M. Lau, A. R. Gerson, R. St. C. Smart. Appl. Surface Sci., 257, N 7 (2011) 2717—2730, https://doi.org/10.1016/j.apsusc.2010.10.051</mixed-citation></citation-alternatives></ref><ref id="cit41"><label>41</label><citation-alternatives><mixed-citation xml:lang="ru">E. S. Ilton, J. E. Post, P. J. Heaney, F. T. Ling, S. N. Kerisit. Appl. Surface Sci., 366 (2016) 475—485, https://doi.org/10.1016/j.apsusc.2015.12.159</mixed-citation><mixed-citation xml:lang="en">E. S. Ilton, J. E. Post, P. J. Heaney, F. T. Ling, S. N. Kerisit. Appl. Surface Sci., 366 (2016) 475—485, https://doi.org/10.1016/j.apsusc.2015.12.159</mixed-citation></citation-alternatives></ref><ref id="cit42"><label>42</label><citation-alternatives><mixed-citation xml:lang="ru">F. R. McFeely, S. P. Kowalczyk, L. Ley, D. A. Shirley. Solid State Commun., 15, N 6 (1974) 1051—1054, https://doi.org/10.1016/0038-1098(74)90529-8</mixed-citation><mixed-citation xml:lang="en">F. R. McFeely, S. P. Kowalczyk, L. Ley, D. A. Shirley. Solid State Commun., 15, N 6 (1974) 1051—1054, https://doi.org/10.1016/0038-1098(74)90529-8</mixed-citation></citation-alternatives></ref><ref id="cit43"><label>43</label><citation-alternatives><mixed-citation xml:lang="ru">S.-J. Shih, R. Sharghi-Moshtaghin, M. R. De Guire, R. Goettler, Z. Xing, Z. Liu, A. H. Heuer. J. Electrochem. Soc., 158, N 10 (2011) B1276—B1283, doi 10.1149/1.3625279</mixed-citation><mixed-citation xml:lang="en">S.-J. Shih, R. Sharghi-Moshtaghin, M. R. De Guire, R. Goettler, Z. Xing, Z. Liu, A. H. Heuer. J. Electrochem. Soc., 158, N 10 (2011) B1276—B1283, doi 10.1149/1.3625279</mixed-citation></citation-alternatives></ref><ref id="cit44"><label>44</label><citation-alternatives><mixed-citation xml:lang="ru">J. S. Foord, R. B. Jackman, G. C. Allen. Philos. Mag. A, 49, N 5 (1984) 657—663, http://dx.doi.org/10.1080/01418618408233293</mixed-citation><mixed-citation xml:lang="en">J. S. Foord, R. B. Jackman, G. C. Allen. Philos. Mag. A, 49, N 5 (1984) 657—663, http://dx.doi.org/10.1080/01418618408233293</mixed-citation></citation-alternatives></ref><ref id="cit45"><label>45</label><citation-alternatives><mixed-citation xml:lang="ru">C. S. Fadley, D. A. Shirley. Phys. Rev. A, 2, N 4 (1970) 1109—1120, https://doi.org/10.1103/PhysRevA.2.1109</mixed-citation><mixed-citation xml:lang="en">C. S. Fadley, D. A. Shirley. Phys. Rev. A, 2, N 4 (1970) 1109—1120, https://doi.org/10.1103/PhysRevA.2.1109</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
