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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-220</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>ПРИМЕНЕНИЕ СПЕКТРОСКОПИИ КОМБИНАЦИОННОГО РАССЕЯНИЯ СВЕТА ДЛЯ ОБНАРУЖЕНИЯ АЦЕТОНА, РАСТВОРЕННОГО В ТРАНСФОРМАТОРНОМ МАСЛЕ</article-title><trans-title-group xml:lang="en"><trans-title>APPLICATION OF RAMAN SPECTROSCOPY FOR THE DETECTION OF ACETONE DISSOLVED IN TRANSFORMER OIL</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Gu</surname><given-names>Z. .</given-names></name><name name-style="western" xml:lang="en"><surname>Gu</surname><given-names>Z. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Chen</surname><given-names>W. .</given-names></name><name name-style="western" xml:lang="en"><surname>Chen</surname><given-names>W. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Du</surname><given-names>L. .</given-names></name><name name-style="western" xml:lang="en"><surname>Du</surname><given-names>L. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Shi</surname><given-names>H. .</given-names></name><name name-style="western" xml:lang="en"><surname>Shi</surname><given-names>H. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Wan</surname><given-names>F. .</given-names></name><name name-style="western" xml:lang="en"><surname>Wan</surname><given-names>F. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Чунцинский университет; Государственный энергетический научно-исследовательский институт</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Chongqing University; State Grid Shandong Electric Power Research Institute</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Чунцинский университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Chongqing University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>10</day><month>03</month><year>2020</year></pub-date><volume>85</volume><issue>2</issue><fpage>205</fpage><lpage>211</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Gu Z..., Chen W..., Du L..., Shi H..., Wan F..., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Gu Z..., Chen W..., Du L..., Shi H..., Wan F...</copyright-holder><copyright-holder xml:lang="en">Gu Z..., Chen W..., Du L..., Shi H..., Wan F...</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/220">https://zhps.ejournal.by/jour/article/view/220</self-uri><abstract><p>Методом конфокальной лазерной КР-спектроскопии выявлены характерные признаки наличия ацетона в трансформаторном масле. Показано, что в качестве характерного спектрального пика для качественного и количественного анализа можно использовать пик КР при 780 см-1. Исследовано влияние глубины обнаружения и температуры образца на качество сигналов КР: оптимальны глубина 3 мм и температура, близкая к комнатной. Зависимость концентрации от отношения интенсивностей пиков КР I780/I893 найдена методом наименьших квадратов. Полученные результаты свидетельствуют о возможности применения метода конфокальной лазерной КР-спектроскопии для определения концентрации ацетона в трансформаторном масле. Указанный метод может служить альтернативой для ускорения in situ анализа концентрации ацетона в трансформаторном масле. </p></abstract><trans-abstract xml:lang="en"><p>The CLRS detection characteristics of acetone dissolved in transformer oil were analyzed. Raman spectral peak at 780 cm-1 was used as the characteristic spectral peak for qualitative and quantitative analyses. The effect of the detection depth and the temperature was investigated in order to obtain good Raman signals. The optimal detection depth and temperature were set as 3 mm and room temperature. A quantitative model relation between concentration and the Raman peak intensity ratioI780/I893 was constructed via the least-squares method. The results demonstrated that CLRS can quantitatively detect the concentration of acetone in transformer oil and CLRS has potential as a useful alternative for accelerating the in-situ analysis of the concentration of acetone in transformer oil. </p></trans-abstract><kwd-group xml:lang="ru"><kwd>силовой трансформатор</kwd><kwd>спектроскопия комбинационного рассеяния света</kwd><kwd>количественный анализ</kwd><kwd>характеристики обнаружения</kwd><kwd>power transformer</kwd><kwd>Raman spectroscopy</kwd><kwd>quantitative analysis</kwd><kwd>detection property</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">T. K. Saha, IEEE Trans. Dielectr. Electr. Insul., 10, 903-917 (2003).</mixed-citation><mixed-citation xml:lang="en">T. K. Saha, IEEE Trans. Dielectr. Electr. Insul., 10, 903-917 (2003).</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">M. Arshad, S. M. Islam, IEEE Trans. Dielectr. Electr. Insul., 18, 1591-1598 (2011).</mixed-citation><mixed-citation xml:lang="en">M. Arshad, S. M. Islam, IEEE Trans. Dielectr. Electr. Insul., 18, 1591-1598 (2011).</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">A. M. Emsley, X. Xiao, R. J. Heywood, M. Ali, Proc. Inst. Electr. Eng. Sci. Meas. Technol., 147, 110-114 (2000).</mixed-citation><mixed-citation xml:lang="en">A. M. Emsley, X. Xiao, R. J. Heywood, M. Ali, Proc. Inst. Electr. Eng. Sci. Meas. Technol., 147, 110-114 (2000).</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">IEC60422, Mineral Insulating Oils in Electrical Equipment - Supervision and Maintenance Guidance (2005).</mixed-citation><mixed-citation xml:lang="en">IEC60422, Mineral Insulating Oils in Electrical Equipment - Supervision and Maintenance Guidance (2005).</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">M. Duval, IEEE Electr. Insul. Mag., 5, 22-27 (1989).</mixed-citation><mixed-citation xml:lang="en">M. Duval, IEEE Electr. Insul. Mag., 5, 22-27 (1989).</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">G. C. Stevens, A. M. Emsley, Proc. Inst. Electr. Eng., Sci. Meas. Technol., 141, 324-334 (1994).</mixed-citation><mixed-citation xml:lang="en">G. C. Stevens, A. M. Emsley, Proc. Inst. Electr. Eng., Sci. Meas. Technol., 141, 324-334 (1994).</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">L. Lundgaard, D. Allan, I. Hohlein, R. Clavreul, M. Dahlund, H.-P. Gasser, R. Heywood, C. Krause, M. C. Lessard, T. K. Saha, V. Sokolov, A. Pablo, Ageing of Cellulose in Mineral-Oil Insulated Transformers, Cigre Brochuer (2007).</mixed-citation><mixed-citation xml:lang="en">L. Lundgaard, D. Allan, I. Hohlein, R. Clavreul, M. Dahlund, H.-P. Gasser, R. Heywood, C. Krause, M. C. Lessard, T. K. Saha, V. Sokolov, A. Pablo, Ageing of Cellulose in Mineral-Oil Insulated Transformers, Cigre Brochuer (2007).</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">J. Jalbert, R. Gilbert, Y. Denos, P. Gervais, IEEE Trans. Power Del., 27, 514-520 (2012).</mixed-citation><mixed-citation xml:lang="en">J. Jalbert, R. Gilbert, Y. Denos, P. Gervais, IEEE Trans. Power Del., 27, 514-520 (2012).</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">S. Okabe, S. Kaneko, M. Kohtoh, T. Amimoto, IEEE Trans. Dielectr. Electr. Insul., 17, 302-311 (2010).</mixed-citation><mixed-citation xml:lang="en">S. Okabe, S. Kaneko, M. Kohtoh, T. Amimoto, IEEE Trans. Dielectr. Electr. Insul., 17, 302-311 (2010).</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">G. Ueta, T. Tsuboi, S. Okabe, T. Amimoto, IEEE Trans. Dielectr. Electr. Insul., 19, 2216-2224 (2012).</mixed-citation><mixed-citation xml:lang="en">G. Ueta, T. Tsuboi, S. Okabe, T. Amimoto, IEEE Trans. Dielectr. Electr. Insul., 19, 2216-2224 (2012).</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">S. Okabe, G. Ueta, T. Tsuboi, IEEE Trans. Dielectr. Electr. Insul., 20, 346-355 (2013).</mixed-citation><mixed-citation xml:lang="en">S. Okabe, G. Ueta, T. Tsuboi, IEEE Trans. Dielectr. Electr. Insul., 20, 346-355 (2013).</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">T. Ishii, T. Oshi, Y. Makino, T. Hara, IEEE/PES T&amp;D 2002 Asia Pacific, 3, 1834-1838 (2002).</mixed-citation><mixed-citation xml:lang="en">T. Ishii, T. Oshi, Y. Makino, T. Hara, IEEE/PES T&amp;D 2002 Asia Pacific, 3, 1834-1838 (2002).</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">O. H. Arroyo, I. Fofana, J. Jalbert, R. Mohamed, IEEE Trans. Dielectr. Electr. Insul., 22, 3625-3632 (2015).</mixed-citation><mixed-citation xml:lang="en">O. H. Arroyo, I. Fofana, J. Jalbert, R. Mohamed, IEEE Trans. Dielectr. Electr. Insul., 22, 3625-3632 (2015).</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">A. C. T. Ko, L. P. Choo-Smith, M. Hewko, M. G. Sowa, C. C. S. Dong, B. Cleghorn, Opt. Express, 14, 203-215 (2006).</mixed-citation><mixed-citation xml:lang="en">A. C. T. Ko, L. P. Choo-Smith, M. Hewko, M. G. Sowa, C. C. S. Dong, B. Cleghorn, Opt. Express, 14, 203-215 (2006).</mixed-citation></citation-alternatives></ref><ref id="cit15"><label>15</label><citation-alternatives><mixed-citation xml:lang="ru">L. V. Doronina-Amitonova, I. V. Fedotov, A. B. Fedotov, K. V. Anokhin, M. L. Hu, C. Y. Wang, A. M. Zheltikov, Opt. Lett., 37, 4642-4644 (2012).</mixed-citation><mixed-citation xml:lang="en">L. V. Doronina-Amitonova, I. V. Fedotov, A. B. Fedotov, K. V. Anokhin, M. L. Hu, C. Y. Wang, A. M. Zheltikov, Opt. Lett., 37, 4642-4644 (2012).</mixed-citation></citation-alternatives></ref><ref id="cit16"><label>16</label><citation-alternatives><mixed-citation xml:lang="ru">I. Pence, A. Mahadevan-Jansen, Chem. Soc. Rev., 45, 1958-1979 (2016).</mixed-citation><mixed-citation xml:lang="en">I. Pence, A. Mahadevan-Jansen, Chem. Soc. Rev., 45, 1958-1979 (2016).</mixed-citation></citation-alternatives></ref><ref id="cit17"><label>17</label><citation-alternatives><mixed-citation xml:lang="ru">M. Okuno, H. Hamaguchi, Opt. Lett., 35, 4096-4098 (2010).</mixed-citation><mixed-citation xml:lang="en">M. Okuno, H. Hamaguchi, Opt. Lett., 35, 4096-4098 (2010).</mixed-citation></citation-alternatives></ref><ref id="cit18"><label>18</label><citation-alternatives><mixed-citation xml:lang="ru">G. Romero, Y. Qiu, R. A. Murray, S. E. Moya, Macromol. Biosci., 2, 234-241 (2013).</mixed-citation><mixed-citation xml:lang="en">G. Romero, Y. Qiu, R. A. Murray, S. E. Moya, Macromol. Biosci., 2, 234-241 (2013).</mixed-citation></citation-alternatives></ref><ref id="cit19"><label>19</label><citation-alternatives><mixed-citation xml:lang="ru">I. Pence, D. Beaulieu, S. Horst, X. Bi, A. Herline, D. Schwartz, A. Mahadevan-Jansen, Biomed. Opt. Express, 8, 524-535 (2017).</mixed-citation><mixed-citation xml:lang="en">I. Pence, D. Beaulieu, S. Horst, X. Bi, A. Herline, D. Schwartz, A. Mahadevan-Jansen, Biomed. Opt. Express, 8, 524-535 (2017).</mixed-citation></citation-alternatives></ref><ref id="cit20"><label>20</label><citation-alternatives><mixed-citation xml:lang="ru">J. W. Chan, D. S. Taylor, T. Zwerdling, S. M. Lane, K. Ihara, T. Huser, Biophys. J., 90, 648-656 (2006).</mixed-citation><mixed-citation xml:lang="en">J. W. Chan, D. S. Taylor, T. Zwerdling, S. M. Lane, K. Ihara, T. Huser, Biophys. J., 90, 648-656 (2006).</mixed-citation></citation-alternatives></ref><ref id="cit21"><label>21</label><citation-alternatives><mixed-citation xml:lang="ru">R. J. Liao, J. Hao, G. Chen, L. J. Yang, IEEE Trans. Dielectr. Electr. Insul., 19, 821-829 (2012).</mixed-citation><mixed-citation xml:lang="en">R. J. Liao, J. Hao, G. Chen, L. J. Yang, IEEE Trans. Dielectr. Electr. Insul., 19, 821-829 (2012).</mixed-citation></citation-alternatives></ref><ref id="cit22"><label>22</label><citation-alternatives><mixed-citation xml:lang="ru">W. G. Chen, Z. L. Gu, J. X. Zou, F. Wan, Y. Z. Xiang, IEEE Trans. Dielectr. Electr. Insul., 19, 915-921 (2016).</mixed-citation><mixed-citation xml:lang="en">W. G. Chen, Z. L. Gu, J. X. Zou, F. Wan, Y. Z. Xiang, IEEE Trans. Dielectr. Electr. Insul., 19, 915-921 (2016).</mixed-citation></citation-alternatives></ref><ref id="cit23"><label>23</label><citation-alternatives><mixed-citation xml:lang="ru">P. Cossee, J. H. Schachtschneider, J. Chem. Phys., 44, 97-111 (1965).</mixed-citation><mixed-citation xml:lang="en">P. Cossee, J. H. Schachtschneider, J. Chem. Phys., 44, 97-111 (1965).</mixed-citation></citation-alternatives></ref><ref id="cit24"><label>24</label><citation-alternatives><mixed-citation xml:lang="ru">H. Torii, M. Musso, M. G. Giorgini, J. Mol. Liq., 134, 129-135 (2007).</mixed-citation><mixed-citation xml:lang="en">H. Torii, M. Musso, M. G. Giorgini, J. Mol. Liq., 134, 129-135 (2007).</mixed-citation></citation-alternatives></ref><ref id="cit25"><label>25</label><citation-alternatives><mixed-citation xml:lang="ru">F. H. Tukhvatullin, U. N. Tashkenbaev, A. Jumabaev, H. Hushvaktov, A. Absanov, G. Sharifov, J. Nonlinear. Opt. Phys., 22, 277-282 (2013).</mixed-citation><mixed-citation xml:lang="en">F. H. Tukhvatullin, U. N. Tashkenbaev, A. Jumabaev, H. Hushvaktov, A. Absanov, G. Sharifov, J. Nonlinear. Opt. Phys., 22, 277-282 (2013).</mixed-citation></citation-alternatives></ref><ref id="cit26"><label>26</label><citation-alternatives><mixed-citation xml:lang="ru">M. Ku, H. Chung, Appl. Spectrosc.,53, 557-564 (1999).</mixed-citation><mixed-citation xml:lang="en">M. Ku, H. Chung, Appl. Spectrosc.,53, 557-564 (1999).</mixed-citation></citation-alternatives></ref><ref id="cit27"><label>27</label><citation-alternatives><mixed-citation xml:lang="ru">T. Somekawa, M. Kasaoka, F. Kawachi, Y. Nagano, M. Fujita, Y. Izawa, Opt. Lett., 38, 1086-1088 (2013)</mixed-citation><mixed-citation xml:lang="en">T. Somekawa, M. Kasaoka, F. Kawachi, Y. Nagano, M. Fujita, Y. Izawa, Opt. Lett., 38, 1086-1088 (2013)</mixed-citation></citation-alternatives></ref><ref id="cit28"><label>28</label><citation-alternatives><mixed-citation xml:lang="ru">G. J. Puppels, W. Colier, J. H. F. Olminkhof, C. Otto, F. F. M. Demul, J. Greve, J. Raman Spectrosc., 22, 217-225 (1991).</mixed-citation><mixed-citation xml:lang="en">G. J. Puppels, W. Colier, J. H. F. Olminkhof, C. Otto, F. F. M. Demul, J. Greve, J. Raman Spectrosc., 22, 217-225 (1991).</mixed-citation></citation-alternatives></ref><ref id="cit29"><label>29</label><citation-alternatives><mixed-citation xml:lang="ru">K. Maquelin, L. P. Choo-Smith, H. P. Endtz, H. A. Bruining, G. J. Puppels, J. Clin. Microbiol., 40, 594-600 (2002).</mixed-citation><mixed-citation xml:lang="en">K. Maquelin, L. P. Choo-Smith, H. P. Endtz, H. A. Bruining, G. J. Puppels, J. Clin. Microbiol., 40, 594-600 (2002).</mixed-citation></citation-alternatives></ref><ref id="cit30"><label>30</label><citation-alternatives><mixed-citation xml:lang="ru">F. Zapata, C. Garcia-Ruiz, Anal. Chem., 88, 6726-6733 (2016).</mixed-citation><mixed-citation xml:lang="en">F. Zapata, C. Garcia-Ruiz, Anal. Chem., 88, 6726-6733 (2016).</mixed-citation></citation-alternatives></ref><ref id="cit31"><label>31</label><citation-alternatives><mixed-citation xml:lang="ru">X. G. Yang, Q. L. Wu, Raman Spectroscopy Analysis and Application, Beijing, National Defense Industry Press (2008) 3-10 (in Chinese).</mixed-citation><mixed-citation xml:lang="en">X. G. Yang, Q. L. Wu, Raman Spectroscopy Analysis and Application, Beijing, National Defense Industry Press (2008) 3-10 (in Chinese).</mixed-citation></citation-alternatives></ref><ref id="cit32"><label>32</label><citation-alternatives><mixed-citation xml:lang="ru">T. Somekawa, A. Tani, M. Fujita, Appl. Phys. Express, 4, 112401-112403 (2011).</mixed-citation><mixed-citation xml:lang="en">T. Somekawa, A. Tani, M. Fujita, Appl. Phys. Express, 4, 112401-112403 (2011).</mixed-citation></citation-alternatives></ref><ref id="cit33"><label>33</label><citation-alternatives><mixed-citation xml:lang="ru">T. Somekawa, M. Fujita, L. Yasukazu, K. Makoto, N. Yoshitomo, IEEE Trans. Dielectr. Electr. Insul., 22, 229-231 (2015).</mixed-citation><mixed-citation xml:lang="en">T. Somekawa, M. Fujita, L. Yasukazu, K. Makoto, N. Yoshitomo, IEEE Trans. Dielectr. Electr. Insul., 22, 229-231 (2015).</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
