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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-321</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>ПОВЫШЕНИЕ ТОЧНОСТИ ОПРЕДЕЛЕНИЯ КР-СДВИГА НА ОСНОВЕ МЕТОДА СРАВНИТЕЛЬНЫХ ИЗМЕРЕНИЙ В РЕАЛЬНОМ МАСШТАБЕ ВРЕМЕНИ</article-title><trans-title-group xml:lang="en"><trans-title>APPROACH TO ENHANCE RAMAN SHIFT ACCURACY BASED ON A REAL-TIME COMPARATIVE MEASUREMENT METHOD</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ding</surname><given-names>X. .</given-names></name><name name-style="western" xml:lang="en"><surname>Ding</surname><given-names>X. .</given-names></name></name-alternatives><email xlink:type="simple">dingxiang@nim.ac.cn</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>F. .</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>F. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>J. .</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>J. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Liu</surname><given-names>W. .</given-names></name><name name-style="western" xml:lang="en"><surname>Liu</surname><given-names>W. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Национальный институт метрологии</institution></aff><aff xml:lang="en"><institution>National Institute of Metrology</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>10</day><month>03</month><year>2020</year></pub-date><volume>85</volume><issue>5</issue><fpage>796</fpage><lpage>802</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ding X..., Li F..., Li J..., Liu W..., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Ding X..., Li F..., Li J..., Liu W...</copyright-holder><copyright-holder xml:lang="en">Ding X..., Li F..., Li J..., Liu W...</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/321">https://zhps.ejournal.by/jour/article/view/321</self-uri><abstract><p>Предложен метод сравнительных измерений в реальном масштабе времени для повышения точности определения сдвигов комбинационного рассеяния (КР) в нескольких экспериментальных конфигурациях. Проанализированы источники ошибок КР-сдвигов. Метод испытан на образцах монокристаллического кремния и полистирола с использованием спектрометра комбинационного рассеяния. Предел точности метода 0.07 см- 1 . Неопределенность измерения КР-сдвига в кремнии 0.2 см- 1 (k = 2). Улучшена также точность измерения сдвига в полистироле. Показано, что метод сравнительных измерений в реальном масштабе времени может значительно повысить точность измерения КР-сдвига.</p></abstract><trans-abstract xml:lang="en"><p>A real-time comparative measurement method is proposed to enhance the measurement accuracy of Raman shifts. Several experimental configurations are presented and demonstrated. The error sources in Raman shifts are also analyzed. The method is tested on a Raman spectrometer by measuring a sample of monocrystalline silicon and a sample of polystyrene. Experimental results indicate that the accuracy limit of the method is 0.07 cm- 1 . The measurement uncertainty of the Raman shift of the silicon is 0.2 cm- 1 (k = 2), and the measurement uncertainty of the polystyrene is also improved. It is shown that the real-time comparative measurement method can remarkably enhance the measurement accuracy of Raman shift, and it applies to Raman spectrometers regardless of whether their exact laser wavelengths are known or not.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>комбинационное рассеяние света</kwd><kwd>сдвиг</kwd><kwd>точность</kwd><kwd>сравнение</kwd><kwd>кремний</kwd><kwd>атомная спектральная линия</kwd><kwd>Raman shift</kwd><kwd>high accuracy</kwd><kwd>intercomparison</kwd><kwd>silicon</kwd><kwd>atomic spectral line</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">B. T. Bowie, D. B. Chase, P. R. Griffiths, Appl. 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