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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-327</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>ОПРЕДЕЛЕНИЕ ОПТИЧЕСКОЙ АНИЗОТРОПИИ НАНОПОРИСТЫХ ПЛЕНОК ОКСИДА АЛЮМИНИЯ МЕТОДАМИ СТОКС-ПОЛЯРИМЕТРИИ И МАТРИЦЫ КОГЕРЕНТНОСТИ</article-title><trans-title-group xml:lang="en"><trans-title>EVALUATION OF OPTICAL ANISOTROPY OF ALUMINA NANOPOROUS FILMS BY STOKES-POLARIMETRY AND COHERENCE MATRIX METHODS</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Длугунович</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Dlugunovich</surname><given-names>V. A.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Жумарь</surname><given-names>А. Ю.</given-names></name><name name-style="western" xml:lang="en"><surname>Zhumar</surname><given-names>A. Yu.</given-names></name></name-alternatives><email xlink:type="simple">a.zhumar@dragon.bas-net.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Мухуров</surname><given-names>Н. И.</given-names></name><name name-style="western" xml:lang="en"><surname>Mukhurov</surname><given-names>N. I.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Институт физики НАН Беларуси</institution></aff><aff xml:lang="en"><institution>B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus</institution></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>ГНПО “Оптика, оптоэлектроника и лазерная техника”</institution></aff><aff xml:lang="en"><institution>State Research and Production Association “Optic, Optoelectronic and Laser Technique”</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>10</day><month>03</month><year>2020</year></pub-date><volume>85</volume><issue>5</issue><fpage>836</fpage><lpage>842</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Длугунович В.А., Жумарь А.Ю., Мухуров Н.И., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Длугунович В.А., Жумарь А.Ю., Мухуров Н.И.</copyright-holder><copyright-holder xml:lang="en">Dlugunovich V.A., Zhumar A.Y., Mukhurov N.I.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/327">https://zhps.ejournal.by/jour/article/view/327</self-uri><abstract><p>Методами стокс-поляриметрии и матрицы когерентности исследовано влияние амплитудной анизотропии нанопористых пленок оксида алюминия и деполяризации прошедшего излучения на разность фаз ортогонально поляризованных компонент излучения, прошедшего исследуемые пленки. Образцы освещались под углами от 0 до 60° линейно поляризованным излучением с азимутом поляризации 45° в диапазоне длин волн 400-1000 нм. Определена систематическая погрешность, вносимая в разности фаз ортогонально поляризованных компонент прошедшего излучения вследствие неучета амплитудной анизотропии материала и деполяризации излучения.</p></abstract><trans-abstract xml:lang="en"><p>The effect of the amplitude anisotropy of nanoporous alumina films and depolarization of the transmitted radiation on the phase shift between the orthogonally polarized components of the transmitted radiation was studied using Stokes-polarimetry and coherence matrix methods. The test samples were illuminated by linearly polarized radiation with the polarization azimuth of 45° in the wavelength range from 400 to 1000 nm. The systematic error introduced into the phase shift between the orthogonally polarized components of the transmitted radiation because of neglecting the material amplitude anisotropy and the depolarization of the transmitted radiation was established.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>нанопористая пленка</kwd><kwd>оксид алюминия</kwd><kwd>параметры Стокса</kwd><kwd>матрица когерентности</kwd><kwd>сдвиг фаз</kwd><kwd>систематическая погрешность</kwd><kwd>nanoporous film</kwd><kwd>alumina</kwd><kwd>Stokes parameters</kwd><kwd>coherence matrix</kwd><kwd>phase shift</kwd><kwd>systematic error</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Nanoporous Alumina: Fabrication, Structure, Properties and Applications, Ed. D. Losic, A. Santos, Springer Series in Materials Science, 219 (2015)</mixed-citation><mixed-citation xml:lang="en">Nanoporous Alumina: Fabrication, Structure, Properties and Applications, Ed. D. Losic, A. Santos, Springer Series in Materials Science, 219 (2015)</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">V. Sokol, S. Gaponenko, V. Yakovtseva, G. Litvinovich, S. Prislopsky, A. Lutich. Proc. SPIE, 7377 (2009) 73770R</mixed-citation><mixed-citation xml:lang="en">V. Sokol, S. Gaponenko, V. Yakovtseva, G. Litvinovich, S. Prislopsky, A. Lutich. Proc. SPIE, 7377 (2009) 73770R</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">S. Gaponenko. Introduction to Nanophotonics, Cambridge University Press (2010)</mixed-citation><mixed-citation xml:lang="en">S. Gaponenko. Introduction to Nanophotonics, Cambridge University Press (2010)</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">S. D. Kulkarni, K. S. Choudhari, C. Santhosh. Proc. Mat. Sci., 5 (2014) 988--994</mixed-citation><mixed-citation xml:lang="en">S. D. Kulkarni, K. S. Choudhari, C. Santhosh. Proc. Mat. Sci., 5 (2014) 988--994</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">I. Maksymov, J. Ferré-Borrull, J. Pallarès, L. F. Marsal. Photon. Nanostruct. Fundam. Appl., 10 (2012) 459--462</mixed-citation><mixed-citation xml:lang="en">I. Maksymov, J. Ferré-Borrull, J. Pallarès, L. F. Marsal. Photon. Nanostruct. Fundam. Appl., 10 (2012) 459--462</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">A. Santos, T. Kumeria, D. Losic. Materials, 7 (2014) 4297--4320</mixed-citation><mixed-citation xml:lang="en">A. Santos, T. Kumeria, D. Losic. Materials, 7 (2014) 4297--4320</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">В. А. Длугунович, А. Ю. Жумарь, С. Н. Курилкина, Н. И. Мухуров. Журн. прикл. спектр., 82, № 5 (2015) 766--772</mixed-citation><mixed-citation xml:lang="en">В. А. Длугунович, А. Ю. Жумарь, С. Н. Курилкина, Н. И. Мухуров. Журн. прикл. спектр., 82, № 5 (2015) 766--772</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">Л. А. Головань, В. Ю. Тимошенко, П. К. Кашкаров. УФН, 177 (2007) 619--638</mixed-citation><mixed-citation xml:lang="en">Л. А. Головань, В. Ю. Тимошенко, П. К. Кашкаров. УФН, 177 (2007) 619--638</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">М. Борн, Э. Вольф. Основы оптики, Москва, Наука (1973)</mixed-citation><mixed-citation xml:lang="en">М. Борн, Э. Вольф. Основы оптики, Москва, Наука (1973)</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">A. A. Lutich, M. B. Danailov, S. Volchek, V. A. Yakovtseva, V. A. Sokol, S. V. Gaponenko. Appl. Phys., B84 (2006) 327--331</mixed-citation><mixed-citation xml:lang="en">A. A. Lutich, M. B. Danailov, S. Volchek, V. A. Yakovtseva, V. A. Sokol, S. V. Gaponenko. Appl. Phys., B84 (2006) 327--331</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">A. A. Lutich, I. S. Molchan, N. V. Gaponenko, S. V. Gaponenko. Proc. SPIE, 6258 (2006) 62580J</mixed-citation><mixed-citation xml:lang="en">A. A. Lutich, I. S. Molchan, N. V. Gaponenko, S. V. Gaponenko. Proc. SPIE, 6258 (2006) 62580J</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">В. Н. Снопко. Поляризационные характеристики оптического излучения и методы их измерения, Минск, Наука и техника (1992)</mixed-citation><mixed-citation xml:lang="en">В. Н. Снопко. Поляризационные характеристики оптического излучения и методы их измерения, Минск, Наука и техника (1992)</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">D. H. Goldstein. Polarized Light, Taylor and Francis Group, LLC (2011)</mixed-citation><mixed-citation xml:lang="en">D. H. Goldstein. Polarized Light, Taylor and Francis Group, LLC (2011)</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">N. I. Mukhurov, I. V. Gasenkova, I. M. Andrukhovich. J. Mater. Sci. Nanotechnol., 1 (2014) 110--116</mixed-citation><mixed-citation xml:lang="en">N. I. Mukhurov, I. V. Gasenkova, I. M. Andrukhovich. J. Mater. Sci. Nanotechnol., 1 (2014) 110--116</mixed-citation></citation-alternatives></ref><ref id="cit15"><label>15</label><citation-alternatives><mixed-citation xml:lang="ru">В. Н. Снопко. Измерит. техника, № 12 (2008) 19--22</mixed-citation><mixed-citation xml:lang="en">В. Н. Снопко. Измерит. техника, № 12 (2008) 19--22</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
