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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-501</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>***</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>***</subject></subj-group></article-categories><title-group><article-title>ПОЛЯРИЗУЮЩЕЕ ПОКРЫТИЕ, ИЗГОТОВЛЕННОЕ С ИСПОЛЬЗОВАНИЕМ МЕТОДА ШИРОКОПОЛОСНОГО СПЕКТРАЛЬНОГО МОНИТОРИНГА</article-title><trans-title-group xml:lang="en"><trans-title>A POLARIZING BEAM SPLITTING COATING FABRICATED WITH THE USE OF THE WAVELENGTH-INDIRECT BROADBAND OPTICAL MONITORING METHOD</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Lv</surname><given-names>Q.</given-names></name><name name-style="western" xml:lang="en"><surname>Lv</surname><given-names>Q.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Далянь 116023; Далянь 116024</p></bio><bio xml:lang="en"><p>Key Laboratory of Chemical Lasers, Dalian 116023; Dalian 116024</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Deng</surname><given-names>S.</given-names></name><name name-style="western" xml:lang="en"><surname>Deng</surname><given-names>S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Далянь 116023</p></bio><bio xml:lang="en"><p>Key Laboratory of Chemical Lasers</p><p>Dalian 116023</p></bio><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>Ch.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>Ch.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Пекин 100864</p></bio><bio xml:lang="en"><p>Beijing 100864</p></bio><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Huangm</surname><given-names>M.</given-names></name><name name-style="western" xml:lang="en"><surname>Huangm</surname><given-names>M.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Далянь 116024</p></bio><bio xml:lang="en"><p>Dalian 116024</p></bio><xref ref-type="aff" rid="aff-4"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>G.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Далянь 116023</p></bio><bio xml:lang="en"><p>Key Laboratory of Chemical Lasers</p><p>Dalian 116023</p></bio><email xlink:type="simple">lig@dicp.ac.cn</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Jin</surname><given-names>Y.</given-names></name><name name-style="western" xml:lang="en"><surname>Jin</surname><given-names>Y.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Далянь 116023</p></bio><bio xml:lang="en"><p>Key Laboratory of Chemical Lasers</p><p>Dalian 116023</p></bio><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Даляньский институт химической физики Китайской АН; Даляньский технологический университет</institution></aff><aff xml:lang="en"><institution>Dalian Institute of Chemical Physics, Chinese Academy of Sciences; School of Materials Science &amp; Engineering, Dalian University of Technology</institution></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Даляньский институт химической физики Китайской АН</institution></aff><aff xml:lang="en"><institution>Dalian Institute of Chemical Physics, Chinese Academy of Sciences</institution></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Бюро научно-исследовательских программ Китайской АН</institution></aff><aff xml:lang="en"><institution>Bureau of Major R&amp;D Programs, Chinese Academy of Sciences</institution></aff></aff-alternatives><aff-alternatives id="aff-4"><aff xml:lang="ru"><institution>Даляньский технологический университет</institution></aff><aff xml:lang="en"><institution>School of Materials Science &amp; Engineering, Dalian University of Technology</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2019</year></pub-date><pub-date pub-type="epub"><day>18</day><month>03</month><year>2020</year></pub-date><volume>86</volume><issue>6</issue><elocation-id>1009(1)-1009(7)</elocation-id><permissions><copyright-statement>Copyright &amp;#x00A9; Lv Q., Deng S., Li C., Huangm M., Li G., Jin Y., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Lv Q., Deng S., Li C., Huangm M., Li G., Jin Y.</copyright-holder><copyright-holder xml:lang="en">Lv Q., Deng S., Li C., Huangm M., Li G., Jin Y.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/501">https://zhps.ejournal.by/jour/article/view/501</self-uri><abstract/><trans-abstract xml:lang="en"/><kwd-group xml:lang="ru"><kwd>ионно-лучевое распыление</kwd><kwd>широкополосный спектральный мониторинг</kwd><kwd>поляризующее покрытие</kwd></kwd-group><kwd-group xml:lang="en"><kwd>ion beam sputtering</kwd><kwd>wavelength-indirect broadband optical monitoring</kwd><kwd>polarizing beam splitting</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">B. 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