The dynamic range of charge-coupled devices (CCD), such as TCD1304АР, detector for atomic emission spectrometers is studied. For this purpose, we used the authors’ novel equipment with original methods for measuring the temperature of sensors and analyzing nonlinear distortions at different signal levels. To control the nonlinearity of the paths of accumulation and charge transfer, we used the principle of reciprocity of the brightness of spectral lines and exposure. Measurement data processing and compensation of nonlinear distortions at different signal levels were carried out by the maximum likelihood method. The conditions were revealed under which distortions occurred not only at large but also at small signals. A method of using the blooming effect to expand the dynamic range of CCD detectors is proposed.