<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-646</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>АНАЛИЗ ПАКЕТОВ ПРОГРАММНОГО ОБЕСПЕЧЕНИЯ ДЛЯ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО ОНЛАЙН-КОНТРОЛЯ МАТЕРИАЛОВ НА КОНВЕЙЕРЕ</article-title><trans-title-group xml:lang="en"><trans-title>EVALUATION OF SOFTWARE PACKAGES FOR ON-LINE X-RAY FLUORESCENCE ANALYSIS OF MATERIALS ON A CONVEYOR</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Летко</surname><given-names>Э. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Letko</surname><given-names>E. V.</given-names></name></name-alternatives><bio xml:lang="ru"/><bio xml:lang="en"/><email xlink:type="simple">office@bsi.lv</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ландман</surname><given-names>К. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Landman</surname><given-names>K. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Рига</p></bio><bio xml:lang="en"/><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Соколов</surname><given-names>А. Д.</given-names></name><name name-style="western" xml:lang="en"><surname>Sokolov</surname><given-names>A. D.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Рига</p></bio><bio xml:lang="en"/><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>ООО “Baltic Scientific Instruments”</institution></aff><aff xml:lang="en"><institution>“Baltic Scientific Instruments”, SIA</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>30</day><month>06</month><year>2020</year></pub-date><volume>87</volume><issue>3</issue><fpage>469</fpage><lpage>472</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Летко Э.В., Ландман К.С., Соколов А.Д., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Летко Э.В., Ландман К.С., Соколов А.Д.</copyright-holder><copyright-holder xml:lang="en">Letko E.V., Landman K.S., Sokolov A.D.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/646">https://zhps.ejournal.by/jour/article/view/646</self-uri><abstract><p>Рентгенофлуоресцентный анализ с использованием метода фундаментальных параметров без необходимости калибровки по стандартным образцам крайне необходим для некоторых применений. Проанализирована точность расчетов концентрации элементов, выполненных с использованием метода фундаментальных параметров в программном обеспечении XRS-FP. Возможность проведения рентгенофлуоресцентного анализа без необходимости в контрольных образцах делает этот программный пакет незаменимым для анализа неизвестных образцов.</p></abstract><trans-abstract xml:lang="en"><p>The use of X-ray fluorescence analysis using the fundamental parameters (FP) method without the need for calibration samples is extremely desirable for some applications. The accuracy of element concentration calculations performed using the FP method with the XRS-FP software package is analysed. The possibility of performing X-ray fluorescence analysis without the need for reference samples renders this software package indispensable for the analysis of unknown samples.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>рентгенофлуоресцентный анализ</kwd><kwd>элементный анализ</kwd><kwd>онлайн-анализ материалов</kwd></kwd-group><kwd-group xml:lang="en"><kwd>XRF analysis</kwd><kwd>elemental analysis</kwd><kwd>on-line material analysis</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Авторы выражают благодарность г-ну М. Халлеру (Crossroads Scientific LLC) за обсуждение особенностей программного пакета XRS-FP для онлайн-приложений.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">A. I. Volkov, N. V. Alov. Problem. Ferrous Metal. Mater. Sci., N 2 (2011) 75—88</mixed-citation><mixed-citation xml:lang="en">A. I. Volkov, N. V. Alov. Problem. Ferrous Metal. Mater. Sci., N 2 (2011) 75—88</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">A. Sokolov, D. Docenko, E. Bliakher, O. Shirokobrod. On-line Analysis of Chrome-Iron Ores on a Conveyor Belt Using X-Ray Fluorescence Analysis. X-Ray Spectrometry (2005) 456—459</mixed-citation><mixed-citation xml:lang="en">A. Sokolov, D. Docenko, E. Bliakher, O. Shirokobrod. On-line Analysis of Chrome-Iron Ores on a Conveyor Belt Using X-Ray Fluorescence Analysis. X-Ray Spectrometry (2005) 456—459</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">E. I. Hasikova, A. D. Sokolov, V. L. Titov. Quantitative Analysis of Uranium and Thorium Containing Materials Using Industrial On-Line XRF Analyser. ALTA U-REE 2017, Perth, WA May 20–27 (2017) 289—299</mixed-citation><mixed-citation xml:lang="en">E. I. Hasikova, A. D. Sokolov, V. L. Titov. Quantitative Analysis of Uranium and Thorium Containing Materials Using Industrial On-Line XRF Analyser. ALTA U-REE 2017, Perth, WA May 20–27 (2017) 289—299</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">E. I. Hasikova, A. D. Sokolov, V. L. Titov. Real-Time X-Ray Fluorescence Analysis of Copper-Nickel Materials Flow on Conveyor Belt. ALTA Ni-Co-Cu 2017, Perth, WA May 20–27 (2017) 326—333</mixed-citation><mixed-citation xml:lang="en">E. I. Hasikova, A. D. Sokolov, V. L. Titov. Real-Time X-Ray Fluorescence Analysis of Copper-Nickel Materials Flow on Conveyor Belt. ALTA Ni-Co-Cu 2017, Perth, WA May 20–27 (2017) 326—333</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">J. Hasikova, A. Sokolov, V.Titov. Proc. 7th Int. Conf. Uranium Mining and Hydrogeology, Springer (2014) 793</mixed-citation><mixed-citation xml:lang="en">J. Hasikova, A. Sokolov, V.Titov. Proc. 7th Int. Conf. Uranium Mining and Hydrogeology, Springer (2014) 793</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">J. Hasikova, V. Titov, A. Sokolov, V. Gostilo. Canad. In-te Mining, Metallurgy and Petroleum – CIM J., 5, N 4 (2014) 256—260</mixed-citation><mixed-citation xml:lang="en">J. Hasikova, V. Titov, A. Sokolov, V. Gostilo. Canad. In-te Mining, Metallurgy and Petroleum – CIM J., 5, N 4 (2014) 256—260</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">J. Hasikova, A. Sokolov, V. Titov, A. Dirba. Proc. Engin., 83 (2014) 455—461</mixed-citation><mixed-citation xml:lang="en">J. Hasikova, A. Sokolov, V. Titov, A. Dirba. Proc. Engin., 83 (2014) 455—461</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">D. Docenko, V. Gostilo, A. Sokolov, A. Rozite. URAM2009 Proc., 22–26.06.2009, Vienna (2009)</mixed-citation><mixed-citation xml:lang="en">D. Docenko, V. Gostilo, A. Sokolov, A. Rozite. URAM2009 Proc., 22–26.06.2009, Vienna (2009)</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Baltic Scientific Instruments. On-line XRF Conveyor Analyzer CON-X; http://bsi.lv/en/products/xrfanalyzers/-line-xrf-conveyor-analyzer-con-x/ (дата доступа 24.09.2019)</mixed-citation><mixed-citation xml:lang="en">Baltic Scientific Instruments. On-line XRF Conveyor Analyzer CON-X; http://bsi.lv/en/products/xrfanalyzers/-line-xrf-conveyor-analyzer-con-x/ (дата доступа 24.09.2019)</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">XRFWin. https://www.tasitechnical.com/xrfwin (дата доступа 10.01.2020)</mixed-citation><mixed-citation xml:lang="en">XRFWin. https://www.tasitechnical.com/xrfwin (дата доступа 10.01.2020)</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">SuperQ. https://www.malvernpanalytical.com/en/products/category/software/x-ray-fluorescencesoftware/superq/ (дата доступа on 10.01.2020)</mixed-citation><mixed-citation xml:lang="en">SuperQ. https://www.malvernpanalytical.com/en/products/category/software/x-ray-fluorescencesoftware/superq/ (дата доступа on 10.01.2020)</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">SPECTRA.ELEMENTS. https://www.bruker.com/products/x-ray-diffraction-and-elemental-analysis/xray-fluorescence/xrf-software.html (дата доступа 10.01.2020)</mixed-citation><mixed-citation xml:lang="en">SPECTRA.ELEMENTS. https://www.bruker.com/products/x-ray-diffraction-and-elemental-analysis/xray-fluorescence/xrf-software.html (дата доступа 10.01.2020)</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">Crossroads Scientific. Software XRS-FP. https://crossroadsscientific.com/XRS-FP.html (дата доступа 24.09.2019)</mixed-citation><mixed-citation xml:lang="en">Crossroads Scientific. Software XRS-FP. https://crossroadsscientific.com/XRS-FP.html (дата доступа 24.09.2019)</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">http://mbh.co.uk/ (дата доступа 15.01.2020)</mixed-citation><mixed-citation xml:lang="en">http://mbh.co.uk/ (дата доступа 15.01.2020)</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
