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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-736</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>Метод количественного измерения латерального разрешения конфокального КР-микроскопа</article-title><trans-title-group xml:lang="en"><trans-title>An improved target method to quantitatively measure the lateral resolution of the confocal Raman microscope</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ding</surname><given-names>X.</given-names></name><name name-style="western" xml:lang="en"><surname>Ding</surname><given-names>X.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Пекин 100029.</p></bio><bio xml:lang="en"><p>Xiang Ding.Beijing 100029.</p></bio><email xlink:type="simple">dingxiang@nim.ac.cn</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Fu</surname><given-names>Y.</given-names></name><name name-style="western" xml:lang="en"><surname>Fu</surname><given-names>Y.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Пекин 100029.</p></bio><bio xml:lang="en"><p>Yanxhe Fu.Beijing 100029.</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>F.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>F.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Пекин 100029.</p></bio><bio xml:lang="en"><p>Fei Li.Beijing 100029.</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Zhang</surname><given-names>J.</given-names></name><name name-style="western" xml:lang="en"><surname>Zhang</surname><given-names>J.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Пекин 100029.</p></bio><bio xml:lang="en"><p>Jiyan Zhang.Beijing 100029.</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Liu</surname><given-names>W.</given-names></name><name name-style="western" xml:lang="en"><surname>Liu</surname><given-names>W.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Пекин 100029.</p></bio><bio xml:lang="en"><p>Wenli Liu.Beijing 100029.</p></bio><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Национальный институт метрологии</institution></aff><aff xml:lang="en"><institution>National Institute of Metrology</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>28</day><month>11</month><year>2020</year></pub-date><volume>87</volume><issue>6</issue><fpage>977</fpage><lpage>983</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ding X., Fu Y., Li F., Zhang J., Liu W., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Ding X., Fu Y., Li F., Zhang J., Liu W.</copyright-holder><copyright-holder xml:lang="en">Ding X., Fu Y., Li F., Zhang J., Liu W.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/736">https://zhps.ejournal.by/jour/article/view/736</self-uri><abstract><p>Предложен метод проверки латерального разрешения конфокального КР-микроскопа (CRM) на основе калибровочной таблицы разрешения. Мишень для тестового изображения состояла из полированной кремниевой подложки, покрытой тонким металлическим рисунком, который обеспечивал высокий контраст и незначительные краевые эффекты. Использование мишени с одним стержнем вместо обычной мишени с тремя стержнями позволило количественно измерить латеральное разрешение CRM. Одностержневые мишени различной ширины использовались для тестирования CRM с номинальным поперечным разрешением ~1 мкм. С помощью теоретической модели изучен отклик CRM на мишень из одного стержня и исследована взаимосвязь между контрастом Майкельсона функции отклика и латеральным разрешением. Предлагаемый метод проверки латерального разрешения имеет относительную повторяемость 5.6 %, что идеально для контроля разрешения. Экспериментальные результаты демонстрируют отличное согласие с результатами моделирования и подтверждают, что метод одностержневой мишени позволяет измерять латеральное разрешение CRM с высокой точностью, эффективностью и воспроизводимостью.</p></abstract><trans-abstract xml:lang="en"><p>The lateral resolution is one of the most important hallmarks for evaluating the imaging performance of a confocal Raman microscope (CRM). A method based on the resolution test chart for testing the lateral resolution of the CRM was proposed. The test imaging target comprised a polished silicon substrate coated with a thin metallic pattern, which provided a high contrast and negligible edge effects. By using a singlebar target instead of a conventional three-bar target, quantitative measurements of the lateral resolution of the CRM were possible. Single-bar targets with different widths were used to test a CRM with a nominal lateral resolution of approximately 1 μm. The response of the C'RM to the single-bar target was studied further with a theoretical model, and the relationship between the Michelson contrast of the response function and the lateral resolution was investigated. Finally, the method used to calculate the lateral resolution was described and tested and shown to have a relative repeatability of only 5.6%, which is ideal for resolution testing. Overall, our experimental results showed excellent agreement with simulation results and proved that the single-bar target method was capable of measuring the lateral resolution of CRMs with high accuracy, efficiency and reproducibility.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>КР-визуализация</kwd><kwd>латеральное разрешение</kwd><kwd>контрольная цель</kwd><kwd>функция Ферми</kwd><kwd>контраст</kwd></kwd-group><kwd-group xml:lang="en"><kwd>Raman imaging</kwd><kwd>lateral resolution</kwd><kwd>testing target</kwd><kwd>Fermi function</kwd><kwd>contrast</kwd></kwd-group><funding-group><funding-statement xml:lang="en">The research was supported by the National Key Research and Development Program of China (2016YFF0201005).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">A. 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