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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-802</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>Влияние ионной имплантации гелия на оптические свойства плавленого кварца</article-title><trans-title-group xml:lang="en"><trans-title>Influence of Helium Ion Implantation on Optical Properties of Fused Silica</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Zhong</surname><given-names>M.</given-names></name><name name-style="western" xml:lang="en"><surname>Zhong</surname><given-names>M.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Гуанхань 618307</p></bio><bio xml:lang="en"><p>Guanghan 618307</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>J. H.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>J. H.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Гуанхань 618307</p></bio><bio xml:lang="en"><p>Guanghan 618307</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>B.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>B.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Чэнду 610054</p></bio><bio xml:lang="en"><p>Chengdu 610054</p></bio><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Tian</surname><given-names>C. X.</given-names></name><name name-style="western" xml:lang="en"><surname>Tian</surname><given-names>C. X.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Чэнду 610054</p></bio><bio xml:lang="en"><p>Chengdu 610054</p></bio><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Xiang</surname><given-names>X.</given-names></name><name name-style="western" xml:lang="en"><surname>Xiang</surname><given-names>X.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Чэнду 610054</p></bio><bio xml:lang="en"><p>Chengdu 610054</p></bio><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Zhou</surname><given-names>C.</given-names></name><name name-style="western" xml:lang="en"><surname>Zhou</surname><given-names>C.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Гуанхань 618307</p></bio><bio xml:lang="en"><p>Guanghan 618307</p></bio><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Yang</surname><given-names>W. F.</given-names></name><name name-style="western" xml:lang="en"><surname>Yang</surname><given-names>W. F.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Гуанхань 618307</p></bio><bio xml:lang="en"><p>Guanghan 618307</p></bio><email xlink:type="simple">ywfcyy@163.com</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Авиационный инженерный институт Университета гражданской авиации Китая</institution></aff><aff xml:lang="en"><institution>Aviation Engineering Institute at Civil Aviation Flight University of China</institution></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Школа физики Китайского университета электронных наук и технологий</institution></aff><aff xml:lang="en"><institution>School of Physics at University of Electronic Science and Technology of China</institution></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Университет гражданской авиации Китая</institution></aff><aff xml:lang="en"><institution>Key Laboratory of Flight Techniques and Flight Safety, CAAC, Civil Aviation Flight University of China</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2021</year></pub-date><pub-date pub-type="epub"><day>28</day><month>05</month><year>2021</year></pub-date><volume>88</volume><issue>2</issue><fpage>197</fpage><lpage>201</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Zhong M., Li J.H., Li B., Tian C.X., Xiang X., Zhou C., Yang W.F., 2021</copyright-statement><copyright-year>2021</copyright-year><copyright-holder xml:lang="ru">Zhong M., Li J.H., Li B., Tian C.X., Xiang X., Zhou C., Yang W.F.</copyright-holder><copyright-holder xml:lang="en">Zhong M., Li J.H., Li B., Tian C.X., Xiang X., Zhou C., Yang W.F.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/802">https://zhps.ejournal.by/jour/article/view/802</self-uri><abstract><p>Высокочистый плавленый кварц имплантирован ионами гелия с энергией 60 кэВ потоком 1.5×1017 см-2. Исследовано влияние имплантации ионов гелия на оптические свойства образцов кремния до и после имплантации гелия с помощью инфракрасной, фотолюминесцентной и УФ-видимой спектрофотометрии. После имплантации ионов гелия результаты рентгеновской фотоэлектронной спектроскопии показывают, что пик Si 2p смещен в сторону более высокой энергии. Наблюдается полоса фотолюминесценции (ФЛ) на 500 нм, при этом интенсивность ФЛзначительно снижается. Однако интенсивности ИК-излучения и оптического поглощения значительно увеличиваются при имплантации ионов. Обсуждается механизм влияния имплантации гелия на оптические свойства плавленого кварца.</p></abstract><trans-abstract xml:lang="en"><p>High-purity fused silica has been implanted with 60-keV helium ions at the fluence of 1.5 • 1017 cm-2. The effects of helium-ion implantation on optical properties of silica samples before and after helium implantation have been investigated by infrared (IR), photoluminescence (PL), and ultraviolet-visible (UV-vis) spectrophotometer. After helium-ion implantation, X-ray photoelectron spectroscopy (XPS) results indicate that Si 2p peak is shifted to higher binding energy. An obvious PL band at 500 nm is observed, and the PL intensity is significantly decreased. However, the intensity of IR and optical absorption is increased greatly by ion implantation. A mechanism for the effects of helium implantation on optical properties of fused silica is discussed.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>гелий-ионная имплантация</kwd><kwd>плавленый кварц</kwd><kwd>фотолюминесценция</kwd><kwd>рентгеновская фотоэлектронная спектроскопия</kwd><kwd>инфракрасный</kwd></kwd-group><kwd-group xml:lang="en"><kwd>helium-ion implantation</kwd><kwd>fused silica</kwd><kwd>photoluminescence</kwd><kwd>X-ray photoelectron spectroscopy</kwd><kwd>infrared</kwd><kwd>ultraviolet-visible spectrophotometer</kwd></kwd-group><funding-group><funding-statement xml:lang="en">This work was supported by the National Natural Science Foundation of China (Grant No. U1830204), National Key R&amp;D Program of China (Grant No. 2018YFC0809500), Key Project of Sichuan Department of Science and Technology (Grant No. 2018GZ0497), and project of Civil Aviation Flight University of China (Grant Nos. BJ2016-04, J2018-56, and CJ2019-01). The authors would like to thank Let Pub for its linguistic assistance during the preparation of this manuscript</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
