<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-9</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>ЛАЗЕРНО-ИСКРОВАЯ ЭМИССИОННАЯ СПЕКТРОСКОПИЯ НА ОСНОВЕ ДЛИННО-ИМПУЛЬСНЫХ ЛАЗЕРОВ И ПАРАМЕТРЫ ПЛАЗМЫ, ГЕНЕРИРУЕМОЙ НА ОБРАЗЦАХ ПОЧВЫ</article-title><trans-title-group xml:lang="en"><trans-title>LASER-INDUCED BREAKDOWN SPECTROSCOPY AND PLASMA CHARACTERIZATION GENERATED BY LONG-PULSE LASER ON SOIL SAMPLES</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Xu</surname><given-names>S. .</given-names></name><name name-style="western" xml:lang="en"><surname>Xu</surname><given-names>S. .</given-names></name></name-alternatives><email xlink:type="simple">dwz_ruoyi@sina.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Duan</surname><given-names>W. .</given-names></name><name name-style="western" xml:lang="en"><surname>Duan</surname><given-names>W. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ning</surname><given-names>R. .</given-names></name><name name-style="western" xml:lang="en"><surname>Ning</surname><given-names>R. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>Q. .</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>Q. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Jiang</surname><given-names>R. .</given-names></name><name name-style="western" xml:lang="en"><surname>Jiang</surname><given-names>R. .</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Шэньянский политехнический университет</institution></aff><aff xml:lang="en"><institution>College of Science, Shenyang Ligong University</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2017</year></pub-date><pub-date pub-type="epub"><day>10</day><month>03</month><year>2020</year></pub-date><volume>84</volume><issue>1</issue><fpage>44</fpage><lpage>48</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Xu S..., Duan W..., Ning R..., Li Q..., Jiang R..., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Xu S..., Duan W..., Ning R..., Li Q..., Jiang R...</copyright-holder><copyright-holder xml:lang="en">Xu S..., Duan W..., Ning R..., Li Q..., Jiang R...</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/9">https://zhps.ejournal.by/jour/article/view/9</self-uri><abstract><p>Плазма образовывалась при фокусировке длинного импульса (80 мкс) YAG:Nd-лазера на образцы почвы, обогащенные хромом. Для построения калибровочной кривой использовано отношение интенсивностей спектральных линий Cr 425.435 и Fe 425.079 нм, взятой в качестве эталона. Получены коэффициент регрессии калибровочной кривой 0.993, предел обнаружения 16 мг/кг, что на 19% меньше, чем при использовании лазера с модулированной добротностью. Метод длинно-импульсной лазерно-искровой эмиссионной спектроскопии позволяет получать лазерно-индуцированную плазму с температурой 15795.907 К и электронной плотностью 2.988´1017 cм-3, что превышает соответствующие параметры плазмы, образованной лазером с модулированной добротностью, на 75 и 24 %. </p></abstract><trans-abstract xml:lang="en"><p>The plasma is generated by focusing a long-pulse (80 μs) Nd:YAG laser on chromium-doped soil samples. The calibration curves are drawn using the intensity ratio of the chromium spectral line at 425.435 nm with the iron spectral line (425.079 nm) as reference. The regression coefficient of the calibration curve is 0.993, and the limit of detection is 16 mg/kg, which is 19% less than that for the case of a Q-switched laser In the method of long-pulse laser-induced breakdown spectroscopy, the laser-induced plasma had a temperature of 15795.907 K and an electron density of 2.988´1017 cm-3, which exceeded the corresponding plasma parameters of the Q-switched laser-induced breakdown spectroscopy by 75% and 24% respectively. </p></trans-abstract><kwd-group xml:lang="ru"><kwd>лазерно-искровая эмиссионная спектроскопия</kwd><kwd>температура плазмы</kwd><kwd>плотность электронов</kwd><kwd>предел обнаружения</kwd><kwd>laser-induced breakdown spectroscopy</kwd><kwd>plasma temperature</kwd><kwd>electron density</kwd><kwd>limit of detection</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">M. A. Gondal, A. Dastageer, M. Maslehuddin, A. J. 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