<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">zhps</journal-id><journal-title-group><journal-title xml:lang="ru">Журнал прикладной спектроскопии</journal-title><trans-title-group xml:lang="en"><trans-title>Zhurnal Prikladnoii Spektroskopii</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">0514-7506</issn><publisher><publisher-name>B. I. Stepanov Institute of Physics of the National Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">zhps-95</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>ПОЛУЭМПИРИЧЕСКАЯ ФОРМУЛА ЗАВИСИМОСТИ ИНТЕНСИВНОСТИ ФЛУОРЕСЦЕНЦИИ НАФТАЛИНА ОТ ТЕМПЕРАТУРЫ И КОНЦЕНТРАЦИИ КИСЛОРОДА</article-title><trans-title-group xml:lang="en"><trans-title>A SEMI-EMPIRICAL FORMULA OF THE DEPENDENCE OF THE FLUORESCENCE INTENSITY OF NAPHTHALENE ON TEMPERATURE AND THE OXYGEN CONCENTRATION</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>An</surname><given-names>B. .</given-names></name><name name-style="western" xml:lang="en"><surname>An</surname><given-names>B. .</given-names></name></name-alternatives><email xlink:type="simple">anbinbinsky@yahoo.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Wang</surname><given-names>Z. -G.</given-names></name><name name-style="western" xml:lang="en"><surname>Wang</surname><given-names>Z. -G.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Yang</surname><given-names>L. -C.</given-names></name><name name-style="western" xml:lang="en"><surname>Yang</surname><given-names>L. -C.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Li</surname><given-names>X. -P.</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>X. -P.</given-names></name></name-alternatives><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Колледж аэрокосмической науки и техники, Национальный университет оборонных технологий</institution></aff><aff xml:lang="en"><institution>College of Aerospace Science and Engineering, National University of Defense Technology</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2017</year></pub-date><pub-date pub-type="epub"><day>10</day><month>03</month><year>2020</year></pub-date><volume>84</volume><issue>4</issue><fpage>527</fpage><lpage>531</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; An B..., Wang Z.-., Yang L.-., Li X.-., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">An B..., Wang Z.-., Yang L.-., Li X.-.</copyright-holder><copyright-holder xml:lang="en">An B..., Wang Z.-., Yang L.-., Li X.-.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://zhps.ejournal.by/jour/article/view/95">https://zhps.ejournal.by/jour/article/view/95</self-uri><abstract><p>Двухкольцевые ароматические углеводороды, такие как нафталин, являются важным присутствующим в керосине флуоресцентным веществом, что используется в методе плоскостной лазерно-индуцированной флуоресценции (PLIF). Количественное измерение концентрации паров керосина с помощью PLIF требует предварительного знания интенсивности флуоресценции нафталина в широком диапазоне температур и концентрации кислорода. Для эффективного применения PLIF с использованием теории столкновений и экспериментальных данных для lлаз = 266 нм и при давлении 0.1 МПа получена полуэмпирическая формула, связывающая интенсивность флуоресценции нафталина и температуру (концентрацию кислорода) и учитывающая колебательные состояния, температуру и кислородное тушение. Формула может предсказать интенсивность флуоресценции нафталина с погрешностью &lt;9%, что подтверждено публикуемыми экспериментальными данными. </p></abstract><trans-abstract xml:lang="en"><p>Two-ring aromatics, such as naphthalene, are important fluorescent components of kerosene in the planar laser induced fluorescent (PLIF) technique. Quantifying measurements of kerosene vapor concentrations by PLIF require a prior knowledge of the fluorescence intensity of naphthalene over a wide temperature and oxygen concentration range. To promote the application of PLIF, a semi-empirical formula based on the collision theory and experimental data at the laser wavelength of 266 nm and a pressure of 0.1 MPa is established to predict the fluorescence intensity of naphthalene at different temperatures and oxygen concentrations. This formula takes vibrational states, temperature, and oxygen quenching into account. Verified by published experimental data, the formula can predict the fluorescence intensity of naphthalene with an error less than 9%.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>нафталин</kwd><kwd>флуоресценция</kwd><kwd>температура</kwd><kwd>кислород</kwd><kwd>naphthalene</kwd><kwd>fluorescence</kwd><kwd>temperature</kwd><kwd>oxygen</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">M. Orain, P. Baranger, C. Ledier, J. Apeloig, F. Grisch, Appl. Phys. B, 116, 729-745 (2014).</mixed-citation><mixed-citation xml:lang="en">M. Orain, P. Baranger, C. Ledier, J. Apeloig, F. Grisch, Appl. Phys. B, 116, 729-745 (2014).</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">M. Orain, H. Verdier, F. Grisch, 13th Int. 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