Changes in the Optical Properties of Thermal-Radiation-Modified Polytetrafluoroethylene Exposed to Accelerated Xenon Ions
Abstract
The interaction characteristics of accelerated 3.2 MeV/nucleon xenon ions with 100 μm-thick thermoradiation-modified polytetrafluoroethylene (TRM-PTFE) films were determined using computer modeling. It was found that, during radiolysis, the initially homogeneous TRM-PTFE sample was transformed into a layered structure including zones of intense and partial radiolysis, as well as a layer of intact polymer. The spatial distribution characteristics of ionization losses and the absorbed dose field in the region of radiation damage around the latent track of a xenon ion were calculated. The optical properties of 100 μm-thick TRM-PTFE films exposed to 3.2 MeV/nucleon xenon ions to a fluence of 1.08 · 106 cm–2 were studied. The optical spectra of TRM-PTFE exhibit absorption maxima at 206 and 476 (374, 578) nm, which may be due to isolated double bonds and polyene structures containing 14 conjugated double bonds, respectively. Radiation-induced interference was detected, which may be due to the formation of a 0.34–0.39 μm-thick radiation-damaged layer, which may be located at a distance of up to ~36 μm from the surface of the TRM-PTFE sample. A correlation was concluded between the predicted estimates of radiation-induced changes in the optical properties of TRM-PTFE films and the experimental data obtained.
About the Authors
O. V. BelovRussian Federation
Dubna, Moscow Region
N. E. Pukhaeva
Russian Federation
Dubna, Moscow Region; Vladikavkaz, Republic of North Ossetia
M. M. Paraipan
Russian Federation
Dubna, Moscow Region; Magurele, Ilfov, Romania
S. M. Ryndya
Russian Federation
Moscow
L. V. Moskvitin
Russian Federation
Moscow
S. V. Slesarenko
Russian Federation
Moscow
S. A. Tokovoy
Russian Federation
Moscow
A. S. Smolyansky
Russian Federation
Moscow
References
1. J. S. Forsythe, D. J. T. Hill. Prog. Polymer Sci., 25 (2000) 101—136
2. A. S. Smolyanskii, E. D. Politova, O. A. Koshkina, M. A. Arsentyev, P. P. Kusch, L. V. Moskvitin, S. V. Slesarenko, D. P. Kiryukhin, L. I. Trakhtenberg. Polymers, 13 (2021) 3679, doi: 10.3390/polym13213678
3. С. А. Хатипов, Е. М. Конова, Н. А. Артамонов. Рос. хим. журн., LII, № 5 (2008) 64—72
4. A. Oshima, A. Udagawa, Y. Morita. Rad. Phys. Chem., 60, N 1-2 (2001) 95—100, doi:10.1016/S0969-806X(00)00321-2
5. E. M. Konova, Yu. E. Sakhno, S. A. Khatipov, V. G. Klimenko, S. T. Sychkova, T. V. Sakhno. Phys. Chem. Sol. State, 12 (2011) 1013—1017
6. C. F. P. da Silva. Study of the Reflectance Distributions of Fluoropolymers and Other Rough Surfaces with Interest to Scintillation Detectors. Dissertação de Doutoramento em Física Especialidade de Física Experimental apresentada à Faculdade de Ciências e Tecnologia da Universidade de Coimbra, Coimbra, Universidade de Coimbra, Faculdade de Ciências e Tecnologia (2009)
7. K. Lee, S. Jockusch, N. J. Turro, R. H. French, R. C. Wheland, M. F. Lemon, A. M. Braun, T. Widerschpan, D. A. Dixon, J. Lie, M. Ivan, P. Zimmerman. J. Am. Chem. Soc., 127 (2005) 8320—8327, doi: 10.1021/ja0440654
8. R. R. Thomas. In: Fluoropolymers 2. Properties, Eds. G. Hougham, P. E. Cassidy, K. Johns, T. Davidson. Ch. 4, New York, Kluwer Academic–Plenum Publishers (1999) 47—68
9. K. Dawes, L. C. Glovery, D. A. Vroomy. In: Physical Properties of Polymers Handbook, Ed. J. E. Mark, Ch. 52, New York, Springer (2007) 867—887, doi: 10.1007/978-0-387-69002-5_52
10. A. Oshima, Y. Tabata, S. Ikeda, K. Otsunaga, H. Kudoh, T. Seguchi. In: JAERI-Conf. 95-003 Proceedings of the 6th Japan-China Bilateral Symposium on Radiation Chemistry, November 6–10, 1994, Waseda University Tokyo, Japan, Eds. Yoshimasa Hama, Yosuke Katsumura, Nobuyuki Kouchi, Keizo Makuuchi, Japan Atomic Energy Research Institute, Tokyo Japan (1995) 487—491
11. M. Adami, L. Guzman, B. Y. Man, A. Miotello, P. M. Ossi. Thin Solid Films, 459 (2004) 318—322, doi: 10.1016/j.tsf.2003.12.139
12. G. De Vincentis, V. Frantellizzi, M. Pacilio. In: Nuclear Medicine and Immunology, Eds. Sara Harsini, Abass Alavi, Nima Rezaei, Ch. 15, Cham, Switzerland: Springer Nature Switzerland AG (2022) 347—357, doi:10.1007/978-3-030-81261-4_15
13. C. Leroy, P.-G. Rancoita. Principles of Radiation Interaction in Matter and Detection, 2nd Ed., Singapore, World Scientific Publishing Co. Pte. Ltd. (2009)
14. J. Kiefer, K. Schenk-Meuser, M. Kost. In: Biological and Medical Research in Space, Eds. D. Moore, P. Bie, H. Oser, Ch. 6, Berlin Heidelberg, Springer-Verlag (1996) 300—367
15. Ф. Ф. Комаров, А. Ф. Комаров, А. М. Миронов, Г. М. Заяц, Ю. В. Макаревич, С. А. Мискевич. Материалы электронной техники, № 4 (2012) 18—23
16. F. F. Komarov. Langmuir, 12 (1996) 199—206
17. Ф. Ф. Комаров. Успехи физ. наук, 173, № 12 (2003) 1287—1318
18. А. М. Борисов, В. А. Казаков, Е. С. Машкова, М. А. Овчинников, Е. А. Питиримова. Поверхность. Рентгеновские, синхротронные и нейтронные исследования, № 4 (2019) 44—52, doi: 10.1134/S020735281904005X
19. J.-L. Leray, P. Paillet, J.-L. Autran. J. Phys. III France, 6, N 12 (1996) 1625—1646, doi: 10.1051/jp3:1996205
20. С. В. Слесаренко. Арматуростроение, 97, № 4 (2015) 72—74
21. Б. П. Голубев. Дозиметрия и защита от ионизирующих излучений. Учебник для вузов, Москва, Атомиздат (1976)
22. В. И. Иванов. Курс дозиметрии. Учебник для вузов, Москва, Атомиздат (1978)
23. R. E. Stoller, M. B. Toloczko, G. S. Was, A. G. Certain, S. Dwaraknath, F. A. Garner. Nucl. Instrum. Meth. Phys. Res. B, 310 (2013) 75—80, doi: 10.1016/j.nimb.2013.05.008
24. J. Apostolakis. In: Molecular Imaging: Computer Reconstruction and Practice, Eds. Y. Lemoigne, A. Caner, Dordrecht, The Netherlands, Springer Science + Business Media B.V. (2008) 73—92, doi: 10.1007/978-1-4020-8752-3
25. J. F. Ziegler, M. D. Ziegler, J. P. Biersack. SRIM – The Stopping and Range of Ions in Matter, Chester, Maryland, USA (2008)
26. К. Б. Тлебаев, В. З. Габдракипов. Вестник Национальной академии наук Республики Казахстан, № 2 (2007) 72—74
27. V. V. Ovchinnikov. Surface & Coatings Technology, 355 (2018) 65—83, doi: 10.1016/j.surfcoat.2018.03.084
28. G. I. Barenblatt. In: Fracture of High Polymers, Eds. H. Kaush, J. A. Hassel, R. I. Jaffe, New York, Plenum Press (1973) 91—111
29. H. H. Rossi, M. Zaider. Microdosimetry and Its Applications, Berlin, Heidelberg, Springer-Verlag (1996), doi: 10.1007/978-3-642-85184-1
30. J. P. Nolan. Univariate Stable Distributions. Models for Heavy Tailed Data, Springer Series in Operations Research and Financial Engineering, Cham, Switzerland, Springer Nature Switzerland AG (2020), doi: 10.1007/978-3-030-52915-4
31. J. Quintanilla, S. Torquato, R. M. Ziff. J. Phys. A: Math. Gen., 33 (2000) L399—L407
32. J. Quintanilla. Phys. Rev. E, 63 (2001) 061108, doi: 10.1103/PhysRevE.63.061108
33. I. A. Drabkin, V. I. Tsaryuk, M. I. Cherkashin, P. P. Kisilitsa, M. G. Chauser, A. N. Chigir’, A. A. Berlin. Vysokomol. Soyed., 10A, N 8 (1968) 1727—1734
34. K. Nagayama, T. Miyamae, R. Mitsumoto, H. Ishii, Y. Guchi, K. Seki. J. Electron. Spectr. Rel. Phenom., 78 (1996) 407—410
35. K. Seki, H. Tanaka, T. Ohta, Yu. Aoki, A. Imamura, H. Fujimoto, H. Yamamoto, H. Inokuchi. Phys. Scripta, 41 (1990) 167—171, doi: 10.1088/0031-8949/41/1/041
36. M. Dole, G. G. A. Bohm. In: Radiation Chemistry. Volume II. Gases, Solids, Organic Liquids. Int. Conf. Sponsored by Argonne National Laboratory Argonne, Ill. Aug. 12—15, 1968, Ed. E. J. Hart; Ch. 36, Advances in Chemistry 82, Am. Chem. Soc., Washington, DC (1968) 525—536
37. M. Schulze, K. Bolwin, E. Giilzow, W. Schnurnberger. Fres. J. Anal. Chem., 353 (1995) 778—784
38. R. Hemley, B. E. Kohler. Biophys. J., 20 (1977) 377—382
39. R. H. Baughman, R. R. Chance. J. Polymer Sci.: Phys. Ed., 14 (1976) 2037—2045, https://doi.org/10.1002/pol.1976.180141109
40. R. L. Christensen, A. Faksh, J. A. Meyers, I. D. W. Samuel, P. Wood, R. R. Schrock, K. C. Hultzsch. J. Phys. Chem. A, 108 (2004) 8229—8236, doi: 10.1021/jp048421g
41. S. R. Allyarov, I. A. Frolov, E. M. Tolstopyatov, D. A. Dixon, M. Vasiliu, L. F. Ivanov, P. N. Grakovich, S. V. Demidov. J. Russ. Laser Res., 40, N 6 (2019) 571—580, doi: 10.1007/s10946-019-09839-8
42. O. Stenzel. The Physics of Thin Film Optical Spectra. An Introduction. Second Edition, Springer Series in Surface Sciences, 44, Cham Switzerland, Springer International Publishing Switzerland (2016), doi: 10.1007/978-3-319-21602-7
43. ГОСТ Р 57941-2017 Композиты полимерные. Инфракрасная спектроскопия. Качественный анализ
44. Х. С. Багдасарьян. Теория радикальной полимеризации, Москва, Наука (1966)
45. W. Eckstein. Computer Simulation of Ion-Solid Interactions, Berlin, Heidelberg, Springer-Verlag (1991) 83—110, doi: 10.1007/978-3-642-73513-4
46. В. Н. Байер, В. М. Катков, В. М. Страховенко. Электромагнитные процессы при высокой энергии в ориентированных монокристаллах, Новосибирск, Наука (1989)
47. V. M. Biryukov, Y. A. Chesnokov, V. I. Kotov. Crystal Channeling and Its Application at High-Energy Accelerators, Berlin, Heidelberg, New York, Springer-Verlag (1997), doi: 10.1007/978-3-662-03407-1
48. J. W. Wilson, H. Tai. Range and Energy Straggling in Ion Beam Transport. NASA/TP-2000-209864, Hampton Virginia, NASA Langley Research Center (2000)
49. K. Suzuki. Fujitsu Sci. Tech. J., 46, N 3 (2010) 307—317
50. J. C. Vareille, J. L. Decossas, J. P. Moliton, J. L. Teyssier. J. Appl. Phys., 56 (1984) 211—214, doi: 10.1063/1.333753
51. Y. Hama, K. Hamanaka, H. Matsumoto, H. Kudoh, T. Sasuga, T. Seguchi. In: JAERI-Conf. 95-003 Proceedings of the 6th Japan-China Bilateral Symposium on Radiation Chemistry. November 6–10, 1994 Waseda University Tokyo, Japan, Ed. Y. Hama, Y. Katsumura, N. Kouchi, K. Makuuchi, Tokyo Japan, Japan Atomic Energy Research Institute (1995) 101—104
Review
For citations:
Belov O.V., Pukhaeva N.E., Paraipan M.M., Ryndya S.M., Moskvitin L.V., Slesarenko S.V., Tokovoy S.A., Smolyansky A.S. Changes in the Optical Properties of Thermal-Radiation-Modified Polytetrafluoroethylene Exposed to Accelerated Xenon Ions. Zhurnal Prikladnoii Spektroskopii. 2026;93(2):226-237. (In Russ.)
JATS XML





















