Preview

Zhurnal Prikladnoii Spektroskopii

Advanced search
Open Access Open Access  Restricted Access Subscription Access

Changes in the Optical Properties of Thermal-Radiation-Modified Polytetrafluoroethylene Exposed to Accelerated Xenon Ions

Abstract

The interaction characteristics of accelerated 3.2 MeV/nucleon xenon ions with 100 μm-thick thermoradiation-modified polytetrafluoroethylene (TRM-PTFE) films were determined using computer modeling. It was found that, during radiolysis, the initially homogeneous TRM-PTFE sample was transformed into a layered structure including zones of intense and partial radiolysis, as well as a layer of intact polymer. The spatial distribution characteristics of ionization losses and the absorbed dose field in the region of radiation damage around the latent track of a xenon ion were calculated. The optical properties of 100 μm-thick TRM-PTFE films exposed to 3.2 MeV/nucleon xenon ions to a fluence of 1.08 · 106 cm2 were studied. The optical spectra of TRM-PTFE exhibit absorption maxima at 206 and 476 (374, 578) nm, which may be due to isolated double bonds and polyene structures containing 14 conjugated double bonds, respectively. Radiation-induced interference was detected, which may be due to the formation of a 0.34–0.39 μm-thick radiation-damaged layer, which may be located at a distance of up to ~36 μm from the surface of the TRM-PTFE sample. A correlation was concluded between the predicted estimates of radiation-induced changes in the optical properties of TRM-PTFE films and the experimental data obtained.

About the Authors

O. V. Belov
Joint Institute for Nuclear Research
Russian Federation

Dubna, Moscow Region



N. E. Pukhaeva
Joint Institute for Nuclear Research; North Ossetian State University named after K.L. Khetagurov
Russian Federation

Dubna, Moscow Region; Vladikavkaz, Republic of North Ossetia



M. M. Paraipan
Joint Institute for Nuclear Research; Space Research Institute
Russian Federation

Dubna, Moscow Region; Magurele, Ilfov, Romania



S. M. Ryndya
National Research Nuclear University MEPhI
Russian Federation

Moscow



L. V. Moskvitin
Quantum-R LLC
Russian Federation

Moscow



S. V. Slesarenko
Quantum-R LLC
Russian Federation

Moscow



S. A. Tokovoy
Poliwood LLC
Russian Federation

Moscow



A. S. Smolyansky
Poliwood LLC
Russian Federation

Moscow



References

1. J. S. Forsythe, D. J. T. Hill. Prog. Polymer Sci., 25 (2000) 101—136

2. A. S. Smolyanskii, E. D. Politova, O. A. Koshkina, M. A. Arsentyev, P. P. Kusch, L. V. Moskvitin, S. V. Slesarenko, D. P. Kiryukhin, L. I. Trakhtenberg. Polymers, 13 (2021) 3679, doi: 10.3390/polym13213678

3. С. А. Хатипов, Е. М. Конова, Н. А. Артамонов. Рос. хим. журн., LII, № 5 (2008) 64—72

4. A. Oshima, A. Udagawa, Y. Morita. Rad. Phys. Chem., 60, N 1-2 (2001) 95—100, doi:10.1016/S0969-806X(00)00321-2

5. E. M. Konova, Yu. E. Sakhno, S. A. Khatipov, V. G. Klimenko, S. T. Sychkova, T. V. Sakhno. Phys. Chem. Sol. State, 12 (2011) 1013—1017

6. C. F. P. da Silva. Study of the Reflectance Distributions of Fluoropolymers and Other Rough Surfaces with Interest to Scintillation Detectors. Dissertação de Doutoramento em Física Especialidade de Física Experimental apresentada à Faculdade de Ciências e Tecnologia da Universidade de Coimbra, Coimbra, Universidade de Coimbra, Faculdade de Ciências e Tecnologia (2009)

7. K. Lee, S. Jockusch, N. J. Turro, R. H. French, R. C. Wheland, M. F. Lemon, A. M. Braun, T. Widerschpan, D. A. Dixon, J. Lie, M. Ivan, P. Zimmerman. J. Am. Chem. Soc., 127 (2005) 8320—8327, doi: 10.1021/ja0440654

8. R. R. Thomas. In: Fluoropolymers 2. Properties, Eds. G. Hougham, P. E. Cassidy, K. Johns, T. Davidson. Ch. 4, New York, Kluwer Academic–Plenum Publishers (1999) 47—68

9. K. Dawes, L. C. Glovery, D. A. Vroomy. In: Physical Properties of Polymers Handbook, Ed. J. E. Mark, Ch. 52, New York, Springer (2007) 867—887, doi: 10.1007/978-0-387-69002-5_52

10. A. Oshima, Y. Tabata, S. Ikeda, K. Otsunaga, H. Kudoh, T. Seguchi. In: JAERI-Conf. 95-003 Proceedings of the 6th Japan-China Bilateral Symposium on Radiation Chemistry, November 6–10, 1994, Waseda University Tokyo, Japan, Eds. Yoshimasa Hama, Yosuke Katsumura, Nobuyuki Kouchi, Keizo Makuuchi, Japan Atomic Energy Research Institute, Tokyo Japan (1995) 487—491

11. M. Adami, L. Guzman, B. Y. Man, A. Miotello, P. M. Ossi. Thin Solid Films, 459 (2004) 318—322, doi: 10.1016/j.tsf.2003.12.139

12. G. De Vincentis, V. Frantellizzi, M. Pacilio. In: Nuclear Medicine and Immunology, Eds. Sara Harsini, Abass Alavi, Nima Rezaei, Ch. 15, Cham, Switzerland: Springer Nature Switzerland AG (2022) 347—357, doi:10.1007/978-3-030-81261-4_15

13. C. Leroy, P.-G. Rancoita. Principles of Radiation Interaction in Matter and Detection, 2nd Ed., Singapore, World Scientific Publishing Co. Pte. Ltd. (2009)

14. J. Kiefer, K. Schenk-Meuser, M. Kost. In: Biological and Medical Research in Space, Eds. D. Moore, P. Bie, H. Oser, Ch. 6, Berlin Heidelberg, Springer-Verlag (1996) 300—367

15. Ф. Ф. Комаров, А. Ф. Комаров, А. М. Миронов, Г. М. Заяц, Ю. В. Макаревич, С. А. Мискевич. Материалы электронной техники, № 4 (2012) 18—23

16. F. F. Komarov. Langmuir, 12 (1996) 199—206

17. Ф. Ф. Комаров. Успехи физ. наук, 173, № 12 (2003) 1287—1318

18. А. М. Борисов, В. А. Казаков, Е. С. Машкова, М. А. Овчинников, Е. А. Питиримова. Поверхность. Рентгеновские, синхротронные и нейтронные исследования, № 4 (2019) 44—52, doi: 10.1134/S020735281904005X

19. J.-L. Leray, P. Paillet, J.-L. Autran. J. Phys. III France, 6, N 12 (1996) 1625—1646, doi: 10.1051/jp3:1996205

20. С. В. Слесаренко. Арматуростроение, 97, № 4 (2015) 72—74

21. Б. П. Голубев. Дозиметрия и защита от ионизирующих излучений. Учебник для вузов, Москва, Атомиздат (1976)

22. В. И. Иванов. Курс дозиметрии. Учебник для вузов, Москва, Атомиздат (1978)

23. R. E. Stoller, M. B. Toloczko, G. S. Was, A. G. Certain, S. Dwaraknath, F. A. Garner. Nucl. Instrum. Meth. Phys. Res. B, 310 (2013) 75—80, doi: 10.1016/j.nimb.2013.05.008

24. J. Apostolakis. In: Molecular Imaging: Computer Reconstruction and Practice, Eds. Y. Lemoigne, A. Caner, Dordrecht, The Netherlands, Springer Science + Business Media B.V. (2008) 73—92, doi: 10.1007/978-1-4020-8752-3

25. J. F. Ziegler, M. D. Ziegler, J. P. Biersack. SRIM – The Stopping and Range of Ions in Matter, Chester, Maryland, USA (2008)

26. К. Б. Тлебаев, В. З. Габдракипов. Вестник Национальной академии наук Республики Казахстан, № 2 (2007) 72—74

27. V. V. Ovchinnikov. Surface & Coatings Technology, 355 (2018) 65—83, doi: 10.1016/j.surfcoat.2018.03.084

28. G. I. Barenblatt. In: Fracture of High Polymers, Eds. H. Kaush, J. A. Hassel, R. I. Jaffe, New York, Plenum Press (1973) 91—111

29. H. H. Rossi, M. Zaider. Microdosimetry and Its Applications, Berlin, Heidelberg, Springer-Verlag (1996), doi: 10.1007/978-3-642-85184-1

30. J. P. Nolan. Univariate Stable Distributions. Models for Heavy Tailed Data, Springer Series in Operations Research and Financial Engineering, Cham, Switzerland, Springer Nature Switzerland AG (2020), doi: 10.1007/978-3-030-52915-4

31. J. Quintanilla, S. Torquato, R. M. Ziff. J. Phys. A: Math. Gen., 33 (2000) L399—L407

32. J. Quintanilla. Phys. Rev. E, 63 (2001) 061108, doi: 10.1103/PhysRevE.63.061108

33. I. A. Drabkin, V. I. Tsaryuk, M. I. Cherkashin, P. P. Kisilitsa, M. G. Chauser, A. N. Chigir’, A. A. Berlin. Vysokomol. Soyed., 10A, N 8 (1968) 1727—1734

34. K. Nagayama, T. Miyamae, R. Mitsumoto, H. Ishii, Y. Guchi, K. Seki. J. Electron. Spectr. Rel. Phenom., 78 (1996) 407—410

35. K. Seki, H. Tanaka, T. Ohta, Yu. Aoki, A. Imamura, H. Fujimoto, H. Yamamoto, H. Inokuchi. Phys. Scripta, 41 (1990) 167—171, doi: 10.1088/0031-8949/41/1/041

36. M. Dole, G. G. A. Bohm. In: Radiation Chemistry. Volume II. Gases, Solids, Organic Liquids. Int. Conf. Sponsored by Argonne National Laboratory Argonne, Ill. Aug. 12—15, 1968, Ed. E. J. Hart; Ch. 36, Advances in Chemistry 82, Am. Chem. Soc., Washington, DC (1968) 525—536

37. M. Schulze, K. Bolwin, E. Giilzow, W. Schnurnberger. Fres. J. Anal. Chem., 353 (1995) 778—784

38. R. Hemley, B. E. Kohler. Biophys. J., 20 (1977) 377—382

39. R. H. Baughman, R. R. Chance. J. Polymer Sci.: Phys. Ed., 14 (1976) 2037—2045, https://doi.org/10.1002/pol.1976.180141109

40. R. L. Christensen, A. Faksh, J. A. Meyers, I. D. W. Samuel, P. Wood, R. R. Schrock, K. C. Hultzsch. J. Phys. Chem. A, 108 (2004) 8229—8236, doi: 10.1021/jp048421g

41. S. R. Allyarov, I. A. Frolov, E. M. Tolstopyatov, D. A. Dixon, M. Vasiliu, L. F. Ivanov, P. N. Grakovich, S. V. Demidov. J. Russ. Laser Res., 40, N 6 (2019) 571—580, doi: 10.1007/s10946-019-09839-8

42. O. Stenzel. The Physics of Thin Film Optical Spectra. An Introduction. Second Edition, Springer Series in Surface Sciences, 44, Cham Switzerland, Springer International Publishing Switzerland (2016), doi: 10.1007/978-3-319-21602-7

43. ГОСТ Р 57941-2017 Композиты полимерные. Инфракрасная спектроскопия. Качественный анализ

44. Х. С. Багдасарьян. Теория радикальной полимеризации, Москва, Наука (1966)

45. W. Eckstein. Computer Simulation of Ion-Solid Interactions, Berlin, Heidelberg, Springer-Verlag (1991) 83—110, doi: 10.1007/978-3-642-73513-4

46. В. Н. Байер, В. М. Катков, В. М. Страховенко. Электромагнитные процессы при высокой энергии в ориентированных монокристаллах, Новосибирск, Наука (1989)

47. V. M. Biryukov, Y. A. Chesnokov, V. I. Kotov. Crystal Channeling and Its Application at High-Energy Accelerators, Berlin, Heidelberg, New York, Springer-Verlag (1997), doi: 10.1007/978-3-662-03407-1

48. J. W. Wilson, H. Tai. Range and Energy Straggling in Ion Beam Transport. NASA/TP-2000-209864, Hampton Virginia, NASA Langley Research Center (2000)

49. K. Suzuki. Fujitsu Sci. Tech. J., 46, N 3 (2010) 307—317

50. J. C. Vareille, J. L. Decossas, J. P. Moliton, J. L. Teyssier. J. Appl. Phys., 56 (1984) 211—214, doi: 10.1063/1.333753

51. Y. Hama, K. Hamanaka, H. Matsumoto, H. Kudoh, T. Sasuga, T. Seguchi. In: JAERI-Conf. 95-003 Proceedings of the 6th Japan-China Bilateral Symposium on Radiation Chemistry. November 6–10, 1994 Waseda University Tokyo, Japan, Ed. Y. Hama, Y. Katsumura, N. Kouchi, K. Makuuchi, Tokyo Japan, Japan Atomic Energy Research Institute (1995) 101—104


Review

For citations:


Belov O.V., Pukhaeva N.E., Paraipan M.M., Ryndya S.M., Moskvitin L.V., Slesarenko S.V., Tokovoy S.A., Smolyansky A.S. Changes in the Optical Properties of Thermal-Radiation-Modified Polytetrafluoroethylene Exposed to Accelerated Xenon Ions. Zhurnal Prikladnoii Spektroskopii. 2026;93(2):226-237. (In Russ.)

Views: 137

JATS XML

ISSN 0514-7506 (Print)