MEASUREMENT OF ETHYLENE CONCENTRATIONS AT HIGH PRESSURE BASED ON TUNABLE DIODE LASER ABSORPTION SPECTROSCOPY NEAR 1620 nm
Abstract
A system for detection of ethylene (C2H4) at high pressure is developed based on tunable diode laser absorption spectroscopy using a distributed feedback laser near 1620 nm. To eliminate the influence of spectral line overlap under high pressure, a differential absorption (peak minus valley) scheme is adopted. The peak and valley wavelengths used for the measurement correspond to 6174.64 and 6174.45 cm-1, respectively. Absorption cross sections of ethylene are measured for the selected peak and valley wavelength. The measured concentration agrees with the known concentration, and the maximum of the standard deviation is 0.746% for all measurements. In addition, long-term continuous measurements indicated good stability of the system. The sensitivity of the system is ~18 ppm with an optimum averaging time of 110 s. All the experimental results validate the applicability of the system in ethylene trace detection.
Keywords
tunable diode laser absorption spectroscopy,
differential absorption,
ethylene,
concentration,
high pressure
Supporting agencies: The work is funded by the National Natural Science Foundation of China (NSFC) (61875079, 61805110, 61475068, 11104237) and the Science and Technology Program of Xuzhou City (No. KC19202).
About the Authors
T. Zhang
College of Physics and Electronic Engineering, Jiangsu Normal University
China
Xuzhou
China
Xuzhou
G. Zhang
College of Physics and Electronic Engineering, Jiangsu Normal University
China
Xuzhou
China
Xuzhou
X. Liu
College of Physics and Electronic Engineering, Jiangsu Normal University
China
Xuzhou
China
Xuzhou
G. Gao
College of Physics and Electronic Engineering, Jiangsu Normal University
China
Xuzhou
China
Xuzhou
T. Cai
College of Physics and Electronic Engineering, Jiangsu Normal University
China
Xuzhou
China
Xuzhou
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Review
For citations:
Zhang T., Zhang G., Liu X., Gao G., Cai T. MEASUREMENT OF ETHYLENE CONCENTRATIONS AT HIGH PRESSURE BASED ON TUNABLE DIODE LASER ABSORPTION SPECTROSCOPY NEAR 1620 nm. Zhurnal Prikladnoii Spektroskopii. 2020;87(4):617-622.
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