For citations:

Rotshteyn V.M., Turdaliev T.K., Ashurov Kh.B. Analysis of Porous Nanosilicon by Raman Spectroscopy. Zhurnal Prikladnoii Spektroskopii. 2022;89(1):51-56. (In Russ.) https://doi.org/10.47612/0514-7506-2022-89-1-51-56