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Super Sub-Nyquist Single-Pixel Terahertz Imaging Using Hadamard Basis
Abstract
We present a super sub-Nyquist Hadamard single-pixel THz imaging system in which the THz waves are modulated by a digital micromirror device and a laser driver. Spatial coding of the THz radiation is performed using the cake-cutting (CC)-order Hadamard basis. THz images are reconstructed from a series of coding sequences of the measurement intensity. We prove that with the use of super sub-Nyquist sampling, single-pixel THz imaging with 87% fidelity and a signal-to-noise ratio of more than 23 dB can be achieved using 10% of the CC-order Hadamard basis patterns. The total variation regularization algorithm is shown to have higher robustness to noise than the Hadamard transform and thus offers a good technical solution for single-pixel THz imaging.
About the Authors
J. Guo
School of Information Engineering, Southwest University of Science and Technology; TianFu college of Southwestern University of Finance and Economics
China
China
Mianyang
Q. Ch. Liu
School of Information Engineering, Southwest University of Science and Technology; Tianfu Institute of Research and Innovation, Southwest University of Science and Technology
China
China
Mianyang, Chengdu
H. Deng
School of Information Engineering, Southwest University of Science and Technology; Tianfu Institute of Research and Innovation, Southwest University of Science and Technology
China
China
Mianyang, Chengdu
G. L. Li
School of Information Engineering, Southwest University of Science and Technology; Tianfu Institute of Research and Innovation, Southwest University of Science and Technology
China
China
Mianyang, Chengdu
L. P. Shang
School of Information Engineering, Southwest University of Science and Technology; Tianfu Institute of Research and Innovation, Southwest University of Science and Technology
China
China
Mianyang, Chengdu
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Review
For citations:
Guo J., Liu Q.Ch., Deng H., Li G.L., Shang L.P. Super Sub-Nyquist Single-Pixel Terahertz Imaging Using Hadamard Basis. Zhurnal Prikladnoii Spektroskopii. 2023;90(5):811.
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