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Microstructure and Raman Scattering of CdS Films Obtained with Chemical Deposition Method

Abstract

The crystallographic structure, elemental composition, and surface morphology of the cadmium sulfide (CdS) thin films chemically deposited at Т = 62 ± 1 о С on glass substrates from aqueous solution consisting of NH4OH (25 %), 0.0096M CdSO4, and 0.8M CS(NH2)2 have been studied. The characteristics of these films have been obtained by the scanning electron microscopy, studies of the phase and elemental composition, as well as Raman spectra. It is shown that the selected solution’s composition and deposition modes allow to synthesize CdS films with stoichiometric composition, consisting of nanocrystals of hexagonal modification suitable for solar cells applications.

About the Authors

E. P. Zaretskaya
Scientific and Practical Center of the National Academy of Sciences of Belarus for Materials Science
Belarus

Minsk



V. Ph. Gremenok
Scientific and Practical Center of the National Academy of Sciences of Belarus for Materials Science
Belarus

Minsk



K. P. Buskis
Scientific and Practical Center of the National Academy of Sciences of Belarus for Materials Science
Belarus

Minsk



O. V. Korolik
Belarusian State University
Belarus

Minsk



S. T. Pashanyan
Institute of Physical Research National Academy of Sciences of Armenia; Institute of Radiophysics and Electronics National Academy of Sciences of Armenia
Armenia

Ashtarak



A. S. Tokmajyan
Institute of Radiophysics and Electronics National Academy of Sciences of Armenia
Armenia

Ashtarak



A. S. Musayelyan
Institute of Radiophysics and Electronics National Academy of Sciences of Armenia
Armenia

Ashtarak



S. G. Petrosyan
Institute of Radiophysics and Electronics National Academy of Sciences of Armenia
Armenia

Ashtarak



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Review

For citations:


Zaretskaya E.P., Gremenok V.P., Buskis K.P., Korolik O.V., Pashanyan S.T., Tokmajyan A.S., Musayelyan A.S., Petrosyan S.G. Microstructure and Raman Scattering of CdS Films Obtained with Chemical Deposition Method. Zhurnal Prikladnoii Spektroskopii. 2024;91(1):32-38. (In Russ.)

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ISSN 0514-7506 (Print)