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Zhurnal Prikladnoii Spektroskopii

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Tikhii A.A., Nikolaenko Yu.M., Kornievets A.S., Svyrydova K.A., Zhikhareva Yu.I., Zhikharev I.V. MODELING OF TRANSITION LAYERS AT THE BOUNDARIES OF THIN-FILM COATINGS AT ELLIPSOMETRIC MEASUREMENTS. Zhurnal Prikladnoii Spektroskopii. 2019;86(6):942-946. (In Russ.)

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ISSN 0514-7506 (Print)
68-2 Nezavisimosti Prosp., Minsk 220072, Belarus
B. I. Stepanov Institute of Physics of the National Academy of Sciences
Telephone/Fax: (37517) 2708457
e-mail: jas@ifanbel.bas-net.by
supported by NEICON (Elpub lab)