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ALGORITHM OF SECOND-ORDER DIFFRACTION CORRECTION IN THE SPECTROMETER WITH A CONCAVE DIFFRACTION GRATING

Abstract

Spectrometers with a diffraction grating of the visible and near IR range have a feature that consists in superimposing a spectrum of the second diffraction order on the first. This leads to distortions of the recorded spectrum in its long-wave region. A second-order diffraction correction method is proposed, based on the representation of the spectrum as the sum of Gauss functions, the parameters of which are determined experimentally for individual wavelengths with subsequent numerical interpolation. Parameterization of the line shape in the second order is also used. The details of the required experiment are described and the method is tested on the example of the SSP-600N spectrometer.

About the Authors

S. I. Bruchkouskaya
A. N. Sevchenko Institute for Applied Physical Problems, Belarusian State University
Belarus
7 Kurchatov Str., Minsk, 220108


G. S. Litvinovich
A. N. Sevchenko Institute for Applied Physical Problems, Belarusian State University
Belarus
7 Kurchatov Str., Minsk, 220108


I. I. Bruchkousky
A. N. Sevchenko Institute for Applied Physical Problems, Belarusian State University
Belarus
7 Kurchatov Str., Minsk, 220108


L. V. Katkovsky
A. N. Sevchenko Institute for Applied Physical Problems, Belarusian State University
Belarus
7 Kurchatov Str., Minsk, 220108


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Review

For citations:


Bruchkouskaya S.I., Litvinovich G.S., Bruchkousky I.I., Katkovsky L.V. ALGORITHM OF SECOND-ORDER DIFFRACTION CORRECTION IN THE SPECTROMETER WITH A CONCAVE DIFFRACTION GRATING. Zhurnal Prikladnoii Spektroskopii. 2019;86(4):620-626. (In Russ.)

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ISSN 0514-7506 (Print)