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NEAR-BAND-EDGE EMISSION OF MECHANICALLY MILLED AND THERMALLY ANNEALED ZnO:Ge PARTICLES

Abstract

This paper reports a novel way for the synthesis of Ge doped ZnO particles by a mechanically milled Ge and ZnO powder mixture (ZnO:Ge) followed by thermal annealing in Ar + 5%H2 to achieve near-band-edge (NBE) emission of ZnO with controllable intensities. The Ge doped ZnO particles were synthesized by mechanical milling of a ZnO and Ge powder mixture up to 50 h in particularly, using different ZnO:Ge ratios and annealing temperatures. The Ge doped ZnO particles were observed to have a rounded morphology with a diameter of ~500 nm when an annealing temperature of 1000oC was used. The Ge doped ZnO particles showed NBE emission of ~380 nm with a suppressed visible band of ~500 nm as a function of the Ge content and annealing temperatures. These results suggest that the current method is very useful for synthesis of Ge doped ZnO particles to obtain NBE emission, which is of particular importance for potential application in the optoelectronic and UV detector field.

About the Authors

H. N. Van
Phenikaa Research and Technology Institute, A&A Green Phoenix Group; Phenikaa Institute for Advanced Study and Faculty of Materials Science and Engineering, Phenikaa University
Viet Nam
Hanoi 10000; Yen Nghia, Ha-Dong District, Hanoi 10000


C. X. Thang
Advanced Institute for Science and Technology (AIST), Hanoi University of Science and Technology (HUST)
Viet Nam
No. 01, Dai Co Viet, Road, Hanoi


T. T. H. Tam
Institute for Economic Informatics Technology, National Economics University
Viet Nam
Hanoi


V. T. N. Minh
School of Chemical Engineering, Hanoi University of Science and Technology (HUST)
Viet Nam
Hanoi


V.-H. Pham
Advanced Institute for Science and Technology (AIST), Hanoi University of Science and Technology (HUST)
Viet Nam
No. 01, Dai Co Viet, Road, Hanoi


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Review

For citations:


Van H.N., Thang C.X., Tam T.T., Minh V.T., Pham V. NEAR-BAND-EDGE EMISSION OF MECHANICALLY MILLED AND THERMALLY ANNEALED ZnO:Ge PARTICLES. Zhurnal Prikladnoii Spektroskopii. 2019;86(4):667(1)-667(5).

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ISSN 0514-7506 (Print)