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Zhurnal Prikladnoii Spektroskopii

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Mukhammad A.I., Gaiduk P.I. Influence of the thickness of the n-Si substrate and its doping level on the absorbing properties of silicon plasmon structures in the infrared range. Zhurnal Prikladnoii Spektroskopii. 2021;88(6):887-894. (In Russ.) https://doi.org/10.47612/0514-7506-2021-88-6-887-894

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ISSN 0514-7506 (Print)