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Structural and Optical Properties of SiC/Si Heterostructures Obtained Using Rapid Vaccum-Thermal Carbidization of Silicon

https://doi.org/10.47612/0514-7506-2022-89-2-204-209

Abstract

TEM investigation revealed that the rapid vacuum-thermal carbidization of silicon at 1100°C leads to the formation of cubic silicon carbide (SiC) layers. The band of the IR transmission spectrum at 798 cm–1 corresponding to the stretching vibration of Si-C and the maximum of Raman spectrum at 793 cm–1 relating to transverse optical phonon mode of SiC confirm the formation of a layer of the cubic SiC politype. The absorption band of Si-O-Si (1100 cm–1) was found using the IR-spectroscopy. The dependence of the transmission coefficient on the wavenumber was determined.

About the Authors

M. V. Lobanok
Belarusian State University
Belarus

 Minsk 



A. I. Mukhammad
Belarusian State University
Belarus

 Minsk 



P. I. Gaiduk
Belarusian State University
Belarus

 Minsk 



References

1. G. Ferro. Sol. State Mater. Sci., 40 (2015) 56—76, https://www.tandfonline.com/doi/abs/10.1080/10408436.2014.940440

2. Wen-Rong Chang, Yean-Kuen Fang, Shyh-Fann Ting, Yong-Shiuan Tsair, Cheng-Nan Chang, Chun-Yu Lin, Shih-Fang Chen. IEEE Electron. Dev. Lett., 24, N 9 (2003) 565—567, https://ieeexplore.ieee.org/document/1224519

3. A. Aldalbahi, E. Li, M. Rivera, R. Velazquez, T. Altalhi, X. Peng, P. X. Feng. Sci. Rep., 6 (2016) 23457, https://www.nature.com/articles/srep23457

4. S. Ogawa, M. Okabe, Y. Ikeda, T. Itoh, N. Yoshida, S. Nonomura. Thin Solid Films, 516, N 5 (2008) 740—742, https://www.sciencedirect.com/science/article/abs/pii/S0040609007009935?via%3Dihub

5. D. Peftitsis, G. Tolstoy, A. Antonopoulos, J. Rabkowski, J. K. Lim, M. Bakowski, L. Anquist, H. P. Nee. IEEE Transact. Power Electron., 27 (2012) 28—36, https://ieeexplore.ieee.org/document/5770230

6. I. A. Skibarko, O. V. Milchanin, P. I. Gaiduk, F. F. Komarov. Inst. Phys. Conf. Ser., 166 (1999) 465—469, https://www.researchgate.net/publication/296464292_Structural_and_optical_properties_of_GaNSiCSi_heterostructures _grown_by_MBE

7. С. А. Кукушкин, А. В. Осипов. ФТТ, 50, № 7 (2008) 1188—1195, http://journals.ioffe.ru/articles/viewPDF/2699

8. Y. Chen, Y. Francescato, J. D. Caldwell, V. Giannini, T. W. W. Maß, O. J. Glembocki, F. J. Bezares, T. Taubner, R. Kasica, M. Hong, S. A. Maier. ACS Photon., 1 (2014) 718—724, https://pubs.acs.org/doi/10.1021/ph500143u

9. P. I. Gaiduk, A. N. Larsen, J. L. Hansen, E. Wendler, W. Wesch. Physica B, 340–342 (2003) 813—817

10. L. A. Falkovsky, J. M. Bluet, J. Camassel. Phys. Rev. B, 57 (1998) 11283, https://journals.aps.org/prb/abstract/10.1103/PhysRevB.57.11283

11. F. A. Johnson. Proc. Phys. Soc., 73 (1959) 265, https://iopscience.iop.org/article/10.1088/0370-1328/73/2/315

12. I. H. Campbell, P. M. Fauchet. Solid State Commun., 58 (1986) 739, https://www.sciencedirect.com/science/article/abs/pii/0038109886905132

13. В. В. Соболев, А. Н. Шестаков. ФТП, 34, № 4 (2000) 447—451, http://elibrary.lt/resursai/Uzsienio%20leidiniai/ioffe/ftp/2000/04/ftp3404_13.pdf

14. И. Г. Аксянов, М. Е. Компан, И. В. Кулькова. ФТТ, 52 (2009) 1724—1728, http://journals.ioffe.ru/articles/viewPDF/1957

15. J. M. Ziman. Еlectrons and Phonons, Oxford, Clarendon Press (1960)

16. С. А. Грудинкин, В. Г. Голубев, А. В. Осипов, Н. А. Феоктистов, С. А. Кукушкин. ФТТ, 57, № 12 (2015) 2469, http://labspt.ru/download/Grudinkin-Golubev-Osipov.pdf

17. T. P. Smirnova, A. M. Badalian, L. V. Yakovkina, V. V. Kaichev, V. I. Bukhtiyarov, A. N. Shmakov, I. P. Asanov, V. I. Rachlin, A. N. Fomina. Thin Solid Films, 429 (2003) 144—151, https://www.sciencedirect.com/science/article/abs/pii/S0040609003004085


Review

For citations:


Lobanok M.V., Mukhammad A.I., Gaiduk P.I. Structural and Optical Properties of SiC/Si Heterostructures Obtained Using Rapid Vaccum-Thermal Carbidization of Silicon. Zhurnal Prikladnoii Spektroskopii. 2022;89(2):204-209. (In Russ.) https://doi.org/10.47612/0514-7506-2022-89-2-204-209

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ISSN 0514-7506 (Print)