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Optical Properties and Electronic Characteristics of Polycrystalline and Amorphous Thin Films of the Al4Sm Alloy

https://doi.org/10.47612/0514-7506-2023-90-1-35-42

Abstract

The optical properties and electronic characteristics of X-ray amorphous and polycrystalline Al4Sm alloy films obtained by vacuum thermal evaporation were studied. The optical constants were measured by the Beattie ellipsometric method in the range of 0.248–7.002 µm. From the spectral dependencies of optical constants, the dispersion dependences of the light conductivity σ, reflectivity R, imaginary and real parts of the dielectric permittivity ε1 and ε2 and functions of characteristic energy loss of electrons Im(ε)–1 were calculated. The effect of the crystal structure of the alloys on the features of their optical spectra was shown. Based on the results of measurements in the infrared region of the spectrum, the electronic characteristics of these alloys were calculated using the two-band conductivity model. 

About the Authors

L. A. Akashev
Institute of Solid State Chemistry of the Ural Branch of the Russian Academy of Sciences
Russian Federation

Ekaterinburg



N. A. Popov
Institute of Solid State Chemistry of the Ural Branch of the Russian Academy of Sciences
Russian Federation

Ekaterinburg



A. A. Makhnev
M. N. Mikheev Institute of Metal Physics of Ural Branch of the Russian Academy of Sciences
Russian Federation

Ekaterinburg



E. S. Vorontsova
Institute of Solid State Chemistry of the Ural Branch of the Russian Academy of Sciences
Russian Federation

Ekaterinburg



V. G. Shevchenko
Institute of Solid State Chemistry of the Ural Branch of the Russian Academy of Sciences
Russian Federation

Ekaterinburg



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Review

For citations:


Akashev L.A., Popov N.A., Makhnev A.A., Vorontsova E.S., Shevchenko V.G. Optical Properties and Electronic Characteristics of Polycrystalline and Amorphous Thin Films of the Al4Sm Alloy. Zhurnal Prikladnoii Spektroskopii. 2023;90(1):35-42. (In Russ.) https://doi.org/10.47612/0514-7506-2023-90-1-35-42

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