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Microstructure and Properties of Y0.1Sr0.9CoO3–x Thin Films Produced by High-Frequency Laser Deposition

https://doi.org/10.47612/0514-7506-2023-90-1-43-47

Abstract

By the method of high-frequency pulse-periodic (f ~ 8–10 kHz) laser action with a wavelength of l = 1.064 μm and a power density of q = 36 MW/cm2 on Y0.1Sr0.9CoO3–x ceramics at a pressure in the vacuum chamber of p = 2 × 10−2 mm pt. nanostructured thin films on a silicon substrate have been obtained. The morphology of the obtained films has been studied using atomic force microscopy. The features of the transmission spectra in the visible, near and mid-IR regions have been revealed. An analysis of the electrical properties of the Y0.1Sr0.9CoO3–x structure has been carried out. 

About the Authors

N. A. Bosak
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Russian Federation


A. N. Chumakov
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Russian Federation


M. V. Bushinsky
NPC National Academy of Sciences of Belarus for Materials Science
Russian Federation


G. M. Chobot
Belarusian State Agrarian Technical University
Russian Federation


L. V. Baran
Belarusian State University
Russian Federation


A. A. Shevchenok
Belarusian State Agrarian Technical University; Belarusian National Technical University
Russian Federation


V. V. Malyutina-Bronskaya
SSPA “Optics, Optoelectronics, and Laser Technology”
Russian Federation


A. A. Ivanov
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Russian Federation

Minsk



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Review

For citations:


Bosak N.A., Chumakov A.N., Bushinsky M.V., Chobot G.M., Baran L.V., Shevchenok A.A., Malyutina-Bronskaya V.V., Ivanov A.A. Microstructure and Properties of Y0.1Sr0.9CoO3–x Thin Films Produced by High-Frequency Laser Deposition. Zhurnal Prikladnoii Spektroskopii. 2023;90(1):43-47. (In Russ.) https://doi.org/10.47612/0514-7506-2023-90-1-43-47

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ISSN 0514-7506 (Print)