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Surface Morphology, Optical and Electrophysical Properties of YVO4 Films
Abstract
Nanostructured thin films on silicon substrate were obtained by high-frequency pulse-periodic (f ~ 13 kHz) action of laser radiation with a wavelength of 1.064 μm and a power density of q = 64 MW/cm2 on yttrium vanadate YVO4 ceramics at a pressure in vacuum chamber of p = 3 Pa. The morphology of thin YVO4 films was studied using atomic force microscopy. Transmission spectra of YVO4 films were obtained in the visible, near and mid-IR regions. The electrophysical characteristics of YVO4 /Si structures were analyzed.
About the Authors
N. A. Bosak
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Belarus
Belarus
Minsk
A. N. Chumakov
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Belarus
Belarus
Minsk
L. V. Baran
Belarusian State University
Belarus
Belarus
Minsk
V. V. Malyutina-Bronskaya
SSPA “Optics, Optoelectronics and Laser Technology”
Belarus
Belarus
Minsk
T. F. Raichenok
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Belarus
Belarus
Minsk
A. A. Ivanov
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Belarus
Belarus
Minsk
V. V. Kiris
B. I. Stepanov Institute of Physics of the National Academy of Sciences of Belarus
Belarus
Belarus
Minsk
E. M. Dyatlova
Belarusian State Technological University
Belarus
Belarus
Minsk
A. A. Shevchenok
Belarusian State Agrarian Technical University
Belarus
Belarus
Minsk
A. V. Buka
Belarusian State Technological University
Belarus
Belarus
Minsk
A. S. Kuzmitskaya
SSPA “Optics, Optoelectronics and Laser Technology”
Belarus
Belarus
Minsk
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Review
For citations:
Bosak N.A., Chumakov A.N., Baran L.V., Malyutina-Bronskaya V.V., Raichenok T.F., Ivanov A.A., Kiris V.V., Dyatlova E.M., Shevchenok A.A., Buka A.V., Kuzmitskaya A.S. Surface Morphology, Optical and Electrophysical Properties of YVO4 Films. Zhurnal Prikladnoii Spektroskopii. 2025;92(2):198-203. (In Russ.)
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