SOME ASPECTS OF THE WAVELENGTH DISPERSIVE X-RAY DETERMINATION OF FLUORINE CONTENT IN VARIOUS MATRICES
Abstract
X-ray fluorescent signals of F Ka, Na Ka, Cl Ka, K Ka, and Ta La were measured by WD-XRF for various fluorine-containing systems: K2TaF7, Na3AlF6, K2ZrF6, NaF, and LiF (with NaCl and wax as additional additives). The data were recorded for 41 samples (in the form of pellets prepared in the laboratory) by more than 200 scans. The analysis of the measured fluorine X-ray fluorescence intensities demonstrated that the balance between absorption and enhancement effects depends strongly on the presence and concentration of other elements in the system. The experimental intensities of X-ray fluorescent radiation of fluorine for different systems with comparable fluorine content could differ by as much as 500%.
About the Authors
M. . Boča
Institute of Inorganic Chemistry, Slovak Academy of Sciences
Russian Federation
Russian Federation
V. . Gurišová
Institute of Inorganic Chemistry, Slovak Academy of Sciences
Russian Federation
Russian Federation
F. . Šimko
Institute of Inorganic Chemistry, Slovak Academy of Sciences
Russian Federation
Russian Federation
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Review
For citations:
Boča M., Gurišová V., Šimko F. SOME ASPECTS OF THE WAVELENGTH DISPERSIVE X-RAY DETERMINATION OF FLUORINE CONTENT IN VARIOUS MATRICES. Zhurnal Prikladnoii Spektroskopii. 2017;84(2):308-315. (In Russ.)
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